SCOPUS 정보 검색 플랫폼

Volumn 109, Issue 6, 2011, Pages

Simultaneous imaging of the topography and dynamic properties of nanomechanical systems by optical beam deflection microscopy

(8) Kosaka, P M a Tamayo, J a Gil Santos, E a Mertens, J a Pini, V a Martnez, N F b Ahumada, O b Calleja, M a

a INSTITUTO DE MICROELECTRÓNICA DE MADRID (Spain)

b MecWins (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC PROPERTY; MICROSCOPY TECHNIQUE; NANOMECHANICAL SYSTEMS; OPTICAL BEAM DEFLECTION; OUT-OF-PLANE DISPLACEMENT; REFLECTED LASER; SIMULTANEOUS IMAGING; STATIC AND DYNAMIC; TWO-DIMENSION; VERTICAL RESOLUTION; VIBRATION MODES;

LASER BEAMS; OPTICAL MICROSCOPY;

VIBRATION ANALYSIS;

EID: 79953655703 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3561812 Document Type: Article

Times cited : (8)

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