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Journal of Materials Chemistry

Volumn 21, Issue 15, 2011, Pages 5805-5811

Electric field-induced nanopatterning of reduced graphene oxide on Si and a p-n diode junction

(6) Seo, Sohyeon a Jin, Changhua a Jang, Young Rae a Lee, Junghyun a Kim, Seong Kyu a Lee, Hyoyoung a

a Sungkyunkwan University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; BASAL PLANES; CHARGE TRANSPORT; CONDUCTIVE ATOMIC FORCE MICROSCOPY; ELECTRONIC COMPONENT; HIGH CONDUCTIVITY; HIGH DENSITY; LANGMUIR-BLODGETT METHODS; LOCAL ELECTRIC FIELD; N-DOPING; NANO PATTERN; NANOPATTERNING; NEGATIVE BIAS; NON DESTRUCTIVE; P-DOPING; P-N DIODE; P-TYPE; SI SUBSTRATES; SINGLE-POT PROCESS;

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; GRAPHENE; ION EXCHANGE; NANOLITHOGRAPHY; ORGANIC POLYMERS; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SUBSTRATES;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 79953213366 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c0jm03939j Document Type: Article

Times cited : (14)

References (32)

1
- 27744534165
- K. S. Novoselov A. K. Geim S. V. Morozov D. Jiang M. I. Katsnelson I. V. Grigorieva S. V. Dubonos A. A. Firsov Nature 2005 438 197 200
- (2005) Nature , vol.438 , pp. 197-200
- Novoselov, K.S.¹ Geim, A.K.² Morozov, S.V.³ Jiang, D.⁴ Katsnelson, M.I.⁵ Grigorieva, I.V.⁶ Dubonos, S.V.⁷ Firsov, A.A.⁸

2
- 27744475163
- Y. Zhang Y. W. Tan H. L. Stormer P. Kim Nature 2005 438 201 204
- (2005) Nature , vol.438 , pp. 201-204
- Zhang, Y.¹ Tan, Y.W.² Stormer, H.L.³ Kim, P.⁴

3
- 33847690144
- A. K. Geim K. S. Novoselov Nat. Mater. 2007 6 183 191
- (2007) Nat. Mater. , vol.6 , pp. 183-191
- Geim, A.K.¹ Novoselov, K.S.²

4
- 33744469329
- C. Berger Z. Song X. Li X. Wu N. Brown C. Naud D. Mayou T. Li J. Hass A. N. Marchenkov E. H. Conrad P. N. First W. A. De Heer Science 2006 312 1191 1196
- (2006) Science , vol.312 , pp. 1191-1196
- Berger, C.¹ Song, Z.² Li, X.³ Wu, X.⁴ Brown, N.⁵ Naud, C.⁶ Mayou, D.⁷ Li, T.⁸ Hass, J.⁹ Marchenkov, A.N.¹⁰ Conrad, E.H.¹¹ First, P.N.¹² De Heer, W.A.¹³

5
- 34249742469
- S. Stankovich D. A. Dikin R. D. Piner K. A. Kohlhaas A. Kleinhammes Y. Jia Y. Wu S. T. Nguyen R. S. Ruoff Carbon 2007 45 1558 1565
- (2007) Carbon , vol.45 , pp. 1558-1565
- Stankovich, S.¹ Dikin, D.A.² Piner, R.D.³ Kohlhaas, K.A.⁴ Kleinhammes, A.⁵ Jia, Y.⁶ Wu, Y.⁷ Nguyen, S.T.⁸ Ruoff, R.S.⁹

6
- 73449099938
- G. Liu X. Zhuang Y. Chen B. Zhang J. Zhu C. X. Zhu K. G. Neoh E. T. Kang Appl. Phys. Lett. 2009 95 253301
- (2009) Appl. Phys. Lett. , vol.95 , pp. 253301
- Liu, G.¹ Zhuang, X.² Chen, Y.³ Zhang, B.⁴ Zhu, J.⁵ Zhu, C.X.⁶ Neoh, K.G.⁷ Kang, E.T.⁸

7
- 36749039718
- C. GÓmez-Navarro R. T. Weitz A. M. Bittner M. Scolari A. Mews M. Burghard K. Kern Nano Lett. 2007 7 3499 3503
- (2007) Nano Lett. , vol.7 , pp. 3499-3503
- Gómez-Navarro, C.¹ Weitz, R.T.² Bittner, A.M.³ Scolari, M.⁴ Mews, A.⁵ Burghard, M.⁶ Kern, K.⁷

8
- 43449107662
- G. Eda G. Fanchini M. Chhowalla Nat. Nanotechnol. 2008 3 270 274
- (2008) Nat. Nanotechnol. , vol.3 , pp. 270-274
- Eda, G.¹ Fanchini, G.² Chhowalla, M.³

9
- 67049114637
- S. Park R. S. Ruoff Nat. Nanotechnol. 2009 4 217 224
- (2009) Nat. Nanotechnol. , vol.4 , pp. 217-224
- Park, S.¹ Ruoff, R.S.²

10
- 45149132017
- H. A. Becerril J. Mao Z. Liu R. M. Stoltenberg Z. Bao Y. Chen ACS Nano 2008 2 463 470
- (2008) ACS Nano , vol.2 , pp. 463-470
- Becerril, H.A.¹ Mao, J.² Liu, Z.³ Stoltenberg, R.M.⁴ Bao, Z.⁵ Chen, Y.⁶

11
- 34547310313
- M. Ishigami J. H. Chen W. G. Cullen M. S. Fuhrer E. D. Williams Nano Lett. 2007 7 1643 1648
- (2007) Nano Lett. , vol.7 , pp. 1643-1648
- Ishigami, M.¹ Chen, J.H.² Cullen, W.G.³ Fuhrer, M.S.⁴ Williams, E.D.⁵

12
- 0001533934
- R. M. Nyffenegger R. M. Penner Chem. Rev. 1997 97 1195 1230
- (1997) Chem. Rev. , vol.97 , pp. 1195-1230
- Nyffenegger, R.M.¹ Penner, R.M.²

13
- 0035846793
- J. Zhao K. Uosaki Langmuir 2001 17 7784 7788
- (2001) Langmuir , vol.17 , pp. 7784-7788
- Zhao, J.¹ Uosaki, K.²

14
- 51349119595
- L. Weng L. Zhang Y. P. Chen L. P. Rokhinson Appl. Phys. Lett. 2008 93 093107
- (2008) Appl. Phys. Lett. , vol.93 , pp. 093107
- Weng, L.¹ Zhang, L.² Chen, Y.P.³ Rokhinson, L.P.⁴

15
- 77957716693
- J. M. Mativetsky E. Treossi E. Orgiu M. Melucci G. P. Veronese P. Samori V. Palermo J. Am. Chem. Soc. 2010 132 14130 14136
- (2010) J. Am. Chem. Soc. , vol.132 , pp. 14130-14136
- Mativetsky, J.M.¹ Treossi, E.² Orgiu, E.³ Melucci, M.⁴ Veronese, G.P.⁵ Samori, P.⁶ Palermo, V.⁷

16
- 77953589078
- Z. Wei D. Wang S. Kim S.-Y. Kim Y. Hu M. K. Yakes A. R. Laracuente Z. Dai S. R. Marder C. Berger W. P. King W. A. de Heer P. E. Sheehan E. Riedo Science 2010 328 1373 1376
- (2010) Science , vol.328 , pp. 1373-1376
- Wei, Z.¹ Wang, D.² Kim, S.³ Kim, S.-Y.⁴ Hu, Y.⁵ Yakes, M.K.⁶ Laracuente, A.R.⁷ Dai, Z.⁸ Marder, S.R.⁹ Berger, C.¹⁰ King, W.P.¹¹ De Heer, W.A.¹² Sheehan, P.E.¹³ Riedo, E.¹⁴

17
- 1842424755
- J. C. Scott Science 2004 304 62 63
- (2004) Science , vol.304 , pp. 62-63
- Scott, J.C.¹

18
- 77950277801
- B. Cho T. W. Kim S. Song Y. Ji M. Jo H. Hwang G. Y. Jung T. Lee Adv. Mater. 2010 22 1228 1232
- (2010) Adv. Mater. , vol.22 , pp. 1228-1232
- Cho, B.¹ Kim, T.W.² Song, S.³ Ji, Y.⁴ Jo, M.⁵ Hwang, H.⁶ Jung, G.Y.⁷ Lee, T.⁸

19
- 58149218430
- V. C. Tung M. J. Allen Y. Yang R. B. Kaner Nat. Nanotechnol. 2009 4 25 29
- (2009) Nat. Nanotechnol. , vol.4 , pp. 25-29
- Tung, V.C.¹ Allen, M.J.² Yang, Y.³ Kaner, R.B.⁴

20
- 38749112127
- X. Wang L. Zhi K. Müllen Nano Lett. 2008 8 323 327
- (2008) Nano Lett. , vol.8 , pp. 323-327
- Wang, X.¹ Zhi, L.² Müllen, K.³

21
- 67749095022
- L. J. Cote F. Kim J. Huang J. Am. Chem. Soc. 2009 131 1043 1049
- (2009) J. Am. Chem. Soc. , vol.131 , pp. 1043-1049
- Cote, L.J.¹ Kim, F.² Huang, J.³

22
- 77953494810
- G. Eda M. Chhowalla Adv. Mater. 2010 22 2392 2415
- (2010) Adv. Mater. , vol.22 , pp. 2392-2415
- Eda, G.¹ Chhowalla, M.²

23
- 42449163021
- S. L. Brandow M.-S. Chen C. S. Dulcey W. J. Dressick Langmuir 2008 24 3888 3896
- (2008) Langmuir , vol.24 , pp. 3888-3896
- Brandow, S.L.¹ Chen, M.-S.² Dulcey, C.S.³ Dressick, W.J.⁴

24
- 40949103623
- H. Angermann J. Rappich L. Korte I. Sieber E. Conrad M. Schmidt K. Hübener J. Polte J. Hauschild Appl. Surf. Sci. 2008 254 3615 3625
- (2008) Appl. Surf. Sci. , vol.254 , pp. 3615-3625
- Angermann, H.¹ Rappich, J.² Korte, L.³ Sieber, I.⁴ Conrad, E.⁵ Schmidt, M.⁶ Hübener, K.⁷ Polte, J.⁸ Hauschild, J.⁹

25
- 66749117817
- M. Zhou Y. Wang Y. Zhai J. Zhai W. Ren F. Wang S. Dong Chem.-Eur. J. 2009 15 6116 6120
- (2009) Chem.-Eur. J. , vol.15 , pp. 6116-6120
- Zhou, M.¹ Wang, Y.² Zhai, Y.³ Zhai, J.⁴ Ren, W.⁵ Wang, F.⁶ Dong, S.⁷

26
- 68749109957
- Z. Wang X. Zhou J. Zhang F. Boey H. Zhang J. Phys. Chem. C 2009 113 14071 14075
- (2009) J. Phys. Chem. C , vol.113 , pp. 14071-14075
- Wang, Z.¹ Zhou, X.² Zhang, J.³ Boey, F.⁴ Zhang, H.⁵

27
- 70349557676
- H. L. Guo X. F. Wang Q. Y. Qian F. B. Wang X. H. Xia ACS Nano 2009 3 2653 2659
- (2009) ACS Nano , vol.3 , pp. 2653-2659
- Guo, H.L.¹ Wang, X.F.² Qian, Q.Y.³ Wang, F.B.⁴ Xia, X.H.⁵

28
- 0033737136
- Y. Cui X. Duan J. Hu C. M. Lieber J. Phys. Chem. B 2000 104 5213 5216
- (2000) J. Phys. Chem. B , vol.104 , pp. 5213-5216
- Cui, Y.¹ Duan, X.² Hu, J.³ Lieber, C.M.⁴

29
- 36448998615
- P. De Wolf J. Snauwaert T. Clarysse W. Vandervorst L. Hellemans Appl. Phys. Lett. 1995 66 1530 1532
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1530-1532
- De Wolf, P.¹ Snauwaert, J.² Clarysse, T.³ Vandervorst, W.⁴ Hellemans, L.⁵

30
- 79955988599
- M. Lazzarino S. Heun B. Ressel K. C. Prince P. Pingue C. Ascoli Appl. Phys. Lett. 2002 81 2842 2844
- (2002) Appl. Phys. Lett. , vol.81 , pp. 2842-2844
- Lazzarino, M.¹ Heun, S.² Ressel, B.³ Prince, K.C.⁴ Pingue, P.⁵ Ascoli, C.⁶

31
- 0032592421
- V. Lehmann S. Rönnebeck J. Electrochem. Soc. 1999 146 2968 2975
- (1999) J. Electrochem. Soc. , vol.146 , pp. 2968-2975
- Lehmann, V.¹ Rönnebeck, S.²

32
- 0001327570
- M. Chhowalla A. C. Ferrari J. Robertson G. A. J. Amaratunga Appl. Phys. Lett. 2000 76 1419 1421
- (2000) Appl. Phys. Lett. , vol.76 , pp. 1419-1421
- Chhowalla, M.¹ Ferrari, A.C.² Robertson, J.³ Amaratunga, G.A.J.⁴

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