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Volumn 109, Issue 5, 2011, Pages

Defect states in nc-Si:H films investigated by surface photovoltage spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATRICES; COMPUTATIONAL STUDIES; DEFECT STATE; ELECTRONIC TRANSITION; HETEROGENEOUS MATERIALS; HYDROGENATED NANOCRYSTALLINE SILICON (NC-SI:H); NC-SI:H; SI NANOCRYSTAL; SURFACE PHOTOVOLTAGE SPECTROSCOPY;

EID: 79953017034     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3553583     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.