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Volumn 72, Issue 1-4, 2002, Pages 559-569
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Surface photovoltage analysis of crystalline silicon for photovoltaic applications
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Author keywords
Minority carrier diffusion length; Multicrystalline Si; Surface photovoltage
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Indexed keywords
CRYSTALLINE MATERIALS;
DIFFUSION;
PHOTOVOLTAIC EFFECTS;
PROCESS CONTROL;
CRYSTALLINE SILICON;
SURFACE PHOTOVOLTAGES (SPV);
SILICON WAFERS;
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EID: 0036533226
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(01)00205-7 Document Type: Article |
Times cited : (13)
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References (7)
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