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Volumn 109, Issue 5, 2011, Pages

Electronic properties and bonding characteristics of AlN:Ag thin film nanocomposites

Author keywords

[No Author keywords available]

Indexed keywords

AG NANOPARTICLE; ALN; ALN THIN FILMS; BONDING CHARACTERISTICS; COMPOSITE SYSTEMS; ENERGY STATE; HRTEM IMAGES; MATRIX; OPTOELECTRONIC APPLICATIONS; STRUCTURAL CHARACTERISTICS; THEORETICAL CALCULATIONS; WURTZITE LATTICE; XRD PATTERNS;

EID: 79953011779     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3554443     Document Type: Article
Times cited : (12)

References (34)
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    • 0037464310 scopus 로고    scopus 로고
    • Microstructure evolution of AIN films deposited under various pressures by RF reactive sputtering
    • DOI 10.1016/S0257-8972(02)00771-5, PII S0257897202007715
    • H. Cheng, Y. Sun, and P. Hing, Surf. Coat. Technol. 166, 231 (2003). 10.1016/S0257-8972(02)00771-5 (Pubitemid 36225343)
    • (2003) Surface and Coatings Technology , vol.166 , Issue.2-3 , pp. 231-236
    • Cheng, H.1    Sun, Y.2    Hing, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.