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Volumn 318, Issue 1, 2011, Pages 418-422

An X-ray diffraction technique for analyzing structural defects including microstrain in nitride materials

Author keywords

A1. Characterization; A1. Defects; A1. X ray diffraction; B1. Nitrides

Indexed keywords

A1. CHARACTERIZATION; A1. DEFECTS; A1. X-RAY DIFFRACTION; ALN; B1. NITRIDES; BRAGG ANGLES; COHERENCE LENGTHS; COMPUTATION TECHNIQUES; CRYSTAL PLANES; EXTENDED ANALYSIS; GROWTH PROCESS; LATTICE TILTS; MICRO-STRAIN; NITRIDE MATERIALS; STRUCTURAL DEFECT; X-RAY DIFFRACTION TECHNIQUES;

EID: 79952737381     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2010.10.019     Document Type: Conference Paper
Times cited : (13)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.