|
Volumn 318, Issue 1, 2011, Pages 418-422
|
An X-ray diffraction technique for analyzing structural defects including microstrain in nitride materials
|
Author keywords
A1. Characterization; A1. Defects; A1. X ray diffraction; B1. Nitrides
|
Indexed keywords
A1. CHARACTERIZATION;
A1. DEFECTS;
A1. X-RAY DIFFRACTION;
ALN;
B1. NITRIDES;
BRAGG ANGLES;
COHERENCE LENGTHS;
COMPUTATION TECHNIQUES;
CRYSTAL PLANES;
EXTENDED ANALYSIS;
GROWTH PROCESS;
LATTICE TILTS;
MICRO-STRAIN;
NITRIDE MATERIALS;
STRUCTURAL DEFECT;
X-RAY DIFFRACTION TECHNIQUES;
DEFECTS;
DIFFRACTION;
GALLIUM NITRIDE;
MATERIALS PROPERTIES;
X RAY DIFFRACTION;
X RAYS;
X RAY DIFFRACTION ANALYSIS;
|
EID: 79952737381
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2010.10.019 Document Type: Conference Paper |
Times cited : (13)
|
References (17)
|