Switching adhesion forces by crossing the metal-insulator transition in Magnéli-type vanadium oxide crystals

Beilstein Journal of Nanotechnology

Volumn 2, Issue 1, 2011, Pages 59-65

  Stegemann, Bert ^a,b   Klemm, Matthias ^c   Horn, Siegfried ^c   Woydt, Mathias ^b  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Adhesion force; Atomic force microscopy; Magn li phases; Metal insulator transition; Vanadium oxide

Indexed keywords

ADHESION FORCES; AFM; ATOMIC FORCE; ATOMIC FORCE MICROSCOPES; CLEAVAGE PLANE; ELECTRONIC MATERIALS; FIRST-ORDER PHASE TRANSITIONS; HOMOLOGOUS SERIES; INTELLIGENT DEVICES; LOW ADHESION; METAL INSULATORS; METALLIC STATE; NANO SCALE; TEMPERATURE-INDUCED; ULTRAHIGH VACUUM CONDITIONS; VANADIUM OXIDE; VANADIUM OXIDES; VARIABLE TEMPERATURE;

ADHESION; ATOMIC FORCE MICROSCOPY; ELECTRONIC STRUCTURE; FRICTION; METAL INSULATOR BOUNDARIES; METALLIC COMPOUNDS; OXIDES; SEMICONDUCTOR INSULATOR BOUNDARIES; STOICHIOMETRY; TEMPERATURE; TITANIUM; VANADIUM; VANADIUM ALLOYS; VANADIUM COMPOUNDS;

METAL INSULATOR TRANSITION;

EID: 79952431581     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.3762/bjnano.2.8     Document Type: Article

References (41)

1. Brückner, W.; Oppermann, H.; Reichelt, W.; Terukow, J. I.; Tschudnowski, F. A.; Wolf, E. Vanadiumoxide; Akademie-Verlag: Berlin, 1983.
2. Schwingenschlögl, U.; Eyert, V. Ann. Phys. (Weinheim, Ger.) 2004, 13, 475-510. doi:10.1002/andp.200410099
3. Hubbard, J. Proc. R. Soc. London, Ser. A 1963, 276, 238-257. doi:10.1098/rspa.1963.0204
4. Magnéli, A. Acta Crystallogr. 1953, 6, 495-500. doi:10.1107/S0365110X53001381
5. Andersson, S.; Magnéli, A. Naturwissenschaften 1956, 43, 495-496. doi:10.1007/BF00632520
6. Magnéli, A.; Andersson, S.; Westmann, S.; Kihlborg, L.; Holmberg, B.; Åsbrink, S.; Nordmark, C. Final technical report 1, DA-91-591-EUC-935; Stockholms Universitet: Stockholm, 1959.
7. Woydt, M.; Skopp, A.; Dörfel, I.; Witke, K. Wear 1998, 218, 84-95. doi:10.1016/S0043-1648(98)00181-1
8. Surnev, S.; Ramsey, M. G.; Netzer, F. P. Prog. Surf. Sci. 2003, 73, 117-165. doi:10.1016/j.progsurf.2003.09.001
9. Babulanam, S. M.; Eriksson, T. S.; Niklasson, G. A.; Granqvist, C. G. Sol. Energy Mater. 1987, 16, 347-363. doi:10.1016/0165-1633(87)90029-3
10. Lopez, R.; Boatner, L. A.; Haynes, T. E.; Haglund, R. F.; Feldman, L. C. Appl. Phys. Lett. 2004, 85, 1410-1412. doi:10.1063/1.1784546
11. Perucchi, A.; Baldassarre, L.; Postorino, P.; Lupi, S. J. Phys.: Condens. Matter 2009, 21, 323202-323218. doi:10.1088/0953-8984/21/32/323202
12. Woydt, M. Tribol. Lett. 2000, 8, 117-130. doi:10.1023/A:1019170831371
13. DelRio, F. W.; de Boer, M. P.; Knapp, J. A.; Reedy, E. D., Jr.; Clews, P. J.; Dunn, M. L. Nat. Mater. 2005, 4, 629-634. doi:10.1038/nmat1431
14. Carpick, R. W.; Salmeron, M. Chem. Rev. 1997, 97, 1163-1194. doi:10.1021/cr960068q
15. Bhushan, B., Ed. Handbook of Micro/Nanotribology, 2nd ed.; CRC Press: Boca Raton, 1999.
16. Lantz, M. A.; Hug, H. J.; Hoffmann, R.; van Schendel, P. J. A.; Kappenberger, P.; Martin, S.; Baratoff, A.; Güntherodt, H.-J. Science 2001, 291, 2580-2583. doi:10.1126/science.1057824
17. Sugimoto, Y.; Pou, P.; Abe, M.; Jelinek, P.; Pérez, R.; Morita, S.; Custance, O. Nature 2007, 446, 64-67. doi:10.1038/nature05530
18. Hertz, H. Journal für die reine und angewandte Mathematik 1882, 92, 156-171. doi:10.1515/crll.1882.92.156
19. Johnson, K. L.; Kendall, K.; Roberts, A. D. Proc. R. Soc. London, Ser. A 1971, 324, 301-313. doi:10.1098/rspa.1971.0141
20. Derjaguin, B. V.; Muller, V. M.; Toporov, Y. P. J. Colloid Interface Sci. 1975, 53, 314-326. doi:10.1016/0021-9797(75)90018-1
21. Schwarz, U. D. J. Colloid Interface Sci. 2003, 261, 99-106. doi:10.1016/S0021-9797(03)00049-3
22. Ducker, W. A.; Senden, T. J.; Pashley, R. M. Nature 1991, 353, 239-241. doi:10.1038/353239a0
23. Kappl, M.; Butt, H.-J. Part. Part. Syst. Charact. 2002, 19, 129-143. doi:10.1002/1521-4117(200207)19:3<129::AID-PPSC129>3.0.CO;2-G
24. Butt, H.-J.; Cappella, B.; Kappl, M. Surf. Sci. Rep. 2005, 59, 1-152. doi:10.1016/j.surfrep.2005.08.003
25. Stegemann, B.; Backhaus, H.; Kloss, H.; Santner, E. Spherical AFM probes for adhesion force measurements on metal single crystals. In Modern Research and Educational Topics in Microscopy, Series 3; Méndez-Vilas, A.; Díaz, J., Eds.; Formatex: Badajoz, Spain, 2007; Vol. 2, pp 820-827.
26. Kachi, S.; Kosuge, K.; Okinaka, H. J. Solid State Chem. 1973, 6, 258-270. doi:10.1016/0022-4596(73)90189-8
27. Popov, V. L. Contact Mechanics and Friction; Springer: Berlin Heidelberg, 2010. doi:10.1007/978-3-642-10803-7
28. Burnham, N. A.; Colton, R. J.; Pollock, H. M. Nanotechnology 1993, 4, 64-80. doi:10.1088/0957-4484/4/2/002
29. Pashley, M. D.; Pethica, J. B.; Tabor, D. Wear 1984, 100, 7-31. doi:10.1016/0043-1648(84)90003-6
30. Gulbiński, W.; Suszko, T.; Pailharey, D. Wear 2003, 254, 988-993. doi:10.1016/S0043-1648(03)00304-1
31. Miyoshi, K. Tribol. Int 1999, 32, 605-616. doi:10.1016/S0301-679X(99)00093-6
32. Maugis, D. J. Colloid Interface Sci. 1992, 150, 243-269. doi:10.1016/0021-9797(92)90285-T
33. Kucharczyk, D.; Niklewski, T. J. Appl. Crystallogr. 1979, 12, 270-373. doi:10.1107/S0021889879012711
34. Vitos, L.; Ruban, A. V.; Skriver, H. L.; Kollár, J. Surf. Sci. 1998, 411, 186-202. doi:10.1016/S0039-6028(98)00363-X
35. Mo, Y.; Turner, K. T.; Szlufarska, I. Nature 2009, 457, 1116-1119. doi:10.1038/nature07748
36. Marwitz, C.; Stegemann, B.; Breitkreiz, M.; Kloss, H.; Woydt, M.; Sturm, H. Surf. Sci., submitted.
37. Nagasawa, K.; Bando, Y.; Takada, T. Jpn. J. Appl. Phys. 1969, 8, 1262. doi:10.1143/JJAP.8.1262
38. Villarrubia, J. S. J. Res. Natl. Inst. Stand. Technol. 1997, 102, 425-454.
39. Neto, C.; Craig, V. S. J. Langmuir 2001, 17, 2097-2099. doi:10.1021/la001506y
40. Torii, A.; Sasaki, M.; Hane, K.; Okuma, S. Meas. Sci. Technol. 1996, 7, 179-184. doi:10.1088/0957-0233/7/2/010
41. Tortonese, M.; Kirk, M. Proc. SPIE 1997, 3009, 53-60. doi:10.1117/12.271229