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Journal of Analytical Atomic Spectrometry

Volumn 26, Issue 4, 2011, Pages 776-783

Analytical performance of pulsed radiofrequency glow discharge optical emission spectrometry for bulk and in-depth profile analysis of conductors and insulators

(4) Alberts, Deborah a Fernández, Beatriz a Pereiro, Rosario a Sanz Medel, Alfredo a

a UNIVERSITY OF OVIEDO (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL PERFORMANCE; BULK MATERIALS; COATED GLASS; COATED SAMPLE; CONDUCTING MATERIALS; CONTINUOUS MODE; DEPTH-PROFILING ANALYSIS; DUTY CYCLES; EMISSION YIELDS; EXPERIMENTAL CONDITIONS; GOLD LAYER; IN-DEPTH PROFILE; INSULATING SUBSTRATES; MULTI-LAYERED; OPTICAL EMISSION SPECTROMETRY; PULSE FREQUENCIES; PULSE WIDTH; PULSED MODE; RADIOFREQUENCY GLOW DISCHARGES; RF-GD-OES; SPUTTERING RATE; SYSTEMATIC STUDY;

COATED MATERIALS; GLASS; GLOW DISCHARGES; GOLD COATINGS; LIGHT EMISSION; OPTICAL EMISSION SPECTROSCOPY; SPECTROMETRY; TIN;

DEPTH PROFILING;

EID: 79952312219 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/c0ja00094a Document Type: Conference Paper

Times cited : (12)

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