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Volumn 23, Issue 9, 2008, Pages 1239-1246
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Pulsed radiofrequency glow discharge time of flight mass spectrometer for the direct analysis of bulk and thin coated glasses
a
a
b
HORIBA LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
DISCHARGE (FLUID MECHANICS);
ELECTRIC DISCHARGES;
GLASS;
GLOW DISCHARGES;
HIGH PERFORMANCE LIQUID CHROMATOGRAPHY;
IONS;
ISOTOPES;
LAWS AND LEGISLATION;
MASS SPECTROMETERS;
MASS SPECTROMETRY;
PHOTORESISTS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PLASMA STABILITY;
PLASMAS;
POWER SPECTRUM;
SECONDARY ION MASS SPECTROMETRY;
SENSITIVITY ANALYSIS;
SPECTROMETERS;
SPECTROMETRY;
ANALYTE IONS;
ANALYTES;
ANALYTICAL PERFORMANCES;
BULK GLASSES;
CERTIFIED REFERENCE MATERIAL;
DELAY TIMES;
DEPTH RESOLUTION;
DIRECT ANALYSIS;
DIRECT SOLID ANALYSIS;
DUTY CYCLES;
FIGURES OF MERIT;
GLASS SUBSTRATES;
IN-DEPTH PROFILING;
ION SIGNALING;
ISOTOPE MASS;
LOW PRESSURE;
LOW-PRESSURE PLASMAS;
MASS SPECTRUM;
OPERATING CONDITIONS;
OPTIMUM VALUE;
PEAK MAXIMA;
PRE-PEAK;
PULSE DURATION;
PULSE PERIOD;
RADIO FREQUENCY GLOW DISCHARGES;
RADIO-FREQUENCY;
RF-GD-OES;
SIGNAL DELAYS;
SIGNAL INTENSITIES;
SIGNAL STABILITY;
THIN COATINGS;
TOF-SIMS;
QUALITY CONTROL;
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EID: 50049095152
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/b804169p Document Type: Article |
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Times cited : (54)
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References (26)
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