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Volumn 396, Issue 8, 2010, Pages 2863-2869

Polymer screening by radiofrequency glow discharge time-of-flight mass spectrometry

(9) Lobo, L a Tuccitto, N b Bordel, N a Pereiro, R a Pisonero, J a Licciardello, A b Tempez, A c Chapon, P c Sanz Medel, A a

a UNIVERSITY OF OVIEDO (Spain)

b UNIVERSITY OF CATANIA (Italy)

c HORIBA LTD (Japan)

Author keywords

Coatings; Depth profiles; Glow discharge; Mass spectrometry; Polymers

Indexed keywords

CONTINUOUS MODE; DEPTH PROFILE; ELEMENTAL COMPOSITIONS; GLOW DISCHARGE MASS SPECTROMETRY; ISOPHTHALATE; METHYLSTYRENE; MOLECULAR DEPTH PROFILING; MOLECULAR INFORMATION; POLYATOMIC ION; POLYMER LAYERS; POLYMER STRUCTURE; POLYMERIC LAYERS; PULSED MODE; QUALITATIVE IDENTIFICATION; RADIOFREQUENCY GLOW DISCHARGES; TIME OF FLIGHT MASS SPECTROMETRY;

DEPTH PROFILING; GLOW DISCHARGES; MASS SPECTROMETERS; MASS SPECTROMETRY; ORGANIC COATINGS; PLASTIC COATINGS; POLYETHYLENE TEREPHTHALATES; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; STYRENE; THERMOPLASTICS;

ORGANIC POLYMERS;

EID: 77951298631 PISSN: 16182642 EISSN: 16182650 Source Type: Journal
DOI: 10.1007/s00216-009-3367-7 Document Type: Article

Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.