Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy

Review of Scientific Instruments

Volumn 82, Issue 2, 2011, Pages

  Wutscher, T ^a   Giessibl, F J ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BREAKING POINT; FORCE MICROSCOPY; FORCE SENSOR; IN-SITU; IN-SITU METHODS; QUARTZ TUNING FORK;

NICKEL OXIDE; PROBES; QUARTZ;

SCANNING PROBE MICROSCOPY;

EID: 79952162813     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3549628     Document Type: Article

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