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Journal of Vacuum Science and Technology B

Volumn 28, Issue 3, 2010, Pages

Preparation of light-atom tips for scanning probe microscopy by explosive delamination

(3) Hofmann, T a Welker, J a Giessibl, F J a

a UNIVERSITY OF REGENSBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; PLATE METAL; SCANNING TUNNELING MICROSCOPY;

A-STABLE; ATOMIC-FORCE-MICROSCOPY; COVALENT RADII; ENHANCED RESOLUTIONS; FOUR ELECTRONS; HIGH ELASTIC MODULUS; LIGHT ATOMS; ORBITALS; SCANNING-PROBE MICROSCOPY; TIP APEX;

BERYLLIUM;

EID: 77952998967 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3294706 Document Type: Conference Paper

Times cited : (8)

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