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Volumn 23, Issue 5, 2011, Pages 299-301

Proton-implantation-isolated separate absorption charge and multiplication 4H-SiC avalanche photodiodes

Author keywords

Avalanche photodiode (APD); photodetector

Indexed keywords

EXTERNAL QUANTUM EFFICIENCY; PROTON IMPLANTATION;

EID: 79951981621     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2010.2101057     Document Type: Article
Times cited : (28)

References (17)
  • 1
    • 0032657521 scopus 로고    scopus 로고
    • 4H-SiC visible blind UV avalanche photodiodes
    • F. Yan, Y. Luo, J. H. Zhao, and G. H. Olsen, "4H-SiC visible blind UV avalanche photodiodes," Electron Lett., vol. 35, pp. 929-930, 1999.
    • (1999) Electron Lett. , vol.35 , pp. 929-930
    • Yan, F.1    Luo, Y.2    Zhao, J.H.3    Olsen, G.H.4
  • 2
    • 0345412054 scopus 로고    scopus 로고
    • Low dark current 4H-SiC avalanche photodiodes
    • X. Guo, A. Beck, B. Yang, and J. C. Campbell, "Low dark current 4H-SiC avalanche photodiodes," Electron. Lett., vol. 39, no. 23, pp. 1673-1674, 2003.
    • (2003) Electron. Lett. , vol.39 , Issue.23 , pp. 1673-1674
    • Guo, X.1    Beck, A.2    Yang, B.3    Campbell, J.C.4
  • 3
    • 65349124357 scopus 로고    scopus 로고
    • 4H-SiC PIN recessed-window avalanche photodiode with high quantum efficiency
    • Sep. 15
    • H.-D. Liu, D. McIntosh, X. Bai, H. Pan, M. Liu, J. C. Campbell, and H. Y. Cha, "4H-SiC PIN recessed-window avalanche photodiode with high quantum efficiency," IEEE Photon. Technol.Lett, vol. 20, no. 18, pp. 1551-1553, Sep. 15, 2008.
    • (2008) IEEE Photon. Technol.Lett , vol.20 , Issue.18 , pp. 1551-1553
    • Liu, H.-D.1    McIntosh, D.2    Bai, X.3    Pan, H.4    Liu, M.5    Campbell, J.C.6    Cha, H.Y.7
  • 4
    • 38749087505 scopus 로고    scopus 로고
    • Comparison of 4H-SiC separate absorption and multipli-cation region avalanche photodiodes structures for UV detection
    • H.-Y. Cha, S. Soloviev, G. Dunne, S. Zelakiewicz, P. Waldrab, and P. Sandvik, "Comparison of 4H-SiC separate absorption and multipli-cation region avalanche photodiodes structures for UV detection," in Proc. IEEE Sensors, 2006, pp. 14-17.
    • (2006) Proc. IEEE Sensors , pp. 14-17
    • Cha, H.-Y.1    Soloviev, S.2    Dunne, G.3    Zelakiewicz, S.4    Waldrab, P.5    Sandvik, P.6
  • 9
    • 33745798957 scopus 로고    scopus 로고
    • Demonstration of ultraviolet separate absorption and multiplication 4H-SiC avalanche photodiodes
    • DOI 10.1109/LPT.2005.860384
    • X. Guo, L. B. Rowland, G. T. Dunne, J. A. Fronheiser, P. M. Sandvik, A. L. Beck, and J. C. Campbell, "Demonstration ofultraviolet separate absorption and multiplication 4H-Si Cavalanche photodiodes," IEEE Photon. Technol. Lett., vol. 18, no. 1, pp. 136-138, Jan. 1, 2006. (Pubitemid 46542516)
    • (2006) IEEE Photonics Technology Letters , vol.18 , Issue.1 , pp. 136-138
    • Guo, X.1    Rowland, L.B.2    Dunne, G.T.3    Fronheiser, J.A.4    Sandvik, P.M.5    Beck, A.L.6    Campbell, J.C.7
  • 10
    • 84918059846 scopus 로고
    • An optimized avalanche photodiode
    • May
    • H. W. Ruegg, "An optimized avalanche photodiode," IEEE Trans. Electron Devices, vol. ED-14, no. 5, pp. 239-251, May 1967.
    • (1967) IEEE Trans. Electron Devices , vol.ED-14 , Issue.5 , pp. 239-251
    • Ruegg, H.W.1
  • 13
    • 0037187703 scopus 로고    scopus 로고
    • Low-noise visible-blind UV avalanche photodiodes with edge terminated by 2° positive bevel
    • DOI 10.1049/el:20020216
    • F. Yan, C. Qin, J. H. Zhao, M. Weiner, B. K. Ng, J. P. R. David, and R. C. Tozer, "Low-noise visible-blind UV avalanche photodiodes with edge terminated by 2 positive bevel," Electron. Lett., vol. 38, no. 7, pp. 335-336, Mar. 2002. (Pubitemid 34300420)
    • (2002) Electronics Letters , vol.38 , Issue.7 , pp. 335-336
    • Yan, F.1    Qin, C.2    Zhao, J.H.3    Weiner, M.4    Ng, B.K.5    David, J.P.R.6    Tozer, R.C.7
  • 14
    • 1842431406 scopus 로고    scopus 로고
    • Edgebreakdown in 4H-SiC avalanche photodiodes
    • Mar.
    • A. L. Beck, B. Yang, X. Guo, and J. C. Campbell, "Edgebreakdown in 4H-SiC avalanche photodiodes," IEEE J. Quantum Electron., vol. 40, no. 3, pp. 321-324, Mar. 2004.
    • (2004) IEEE J. Quantum Electron. , vol.40 , Issue.3 , pp. 321-324
    • Beck, A.L.1    Yang, B.2    Guo, X.3    Campbell, J.C.4
  • 16
    • 70349647012 scopus 로고    scopus 로고
    • Avalanche photodiodepunch-through gain determina-tion through excess noise analysis
    • H.-D. Liu, H. Pan, C. Hu, D. McIntosh, Z. Lu, J. Campbell, Y. Kang, and M. Morse, "Avalanche photodiodepunch-through gain determina-tion through excess noise analysis," J. Appl. Phys., vol. 106, no. 6, pp. 064507-064507, 2009.
    • (2009) J. Appl. Phys. , vol.106 , Issue.6 , pp. 064507-064507
    • Liu, H.-D.1    Pan, H.2    Hu, C.3    McIntosh, D.4    Lu, Z.5    Campbell, J.6    Kang, Y.7    Morse, M.8
  • 17
    • 26844524747 scopus 로고    scopus 로고
    • Spatial nonuniformity of 4H-SiC avalanche photodiodes at high gain
    • DOI 10.1109/JQE.2005.854132
    • X. Guo, A. L. Beck, J. C. Campbell, D. Emerson, and J. Sumakeris, "Spatial nonuniformity of4H-SiC avalanche photodiodes at high gain," IEEEJ. QuantumElectron., vol. 41, no. 10, pp. 1213-1216, Oct. 2005. (Pubitemid 41447435)
    • (2005) IEEE Journal of Quantum Electronics , vol.41 , Issue.10 , pp. 1213-1216
    • Guo, X.1    Beck, A.L.2    Campbell, J.C.3    Emerson, D.4    Sumakeris, J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.