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Volumn 106, Issue 6, 2009, Pages

Avalanche photodiode punch-through gain determination through excess noise analysis

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE STRUCTURES; EXCESS NOISE; MULTIPLICATION GAIN; NEW APPROACHES; PERFORMANCE PARAMETERS; PUNCH-THROUGH; SEPARATE ABSORPTION AND MULTIPLICATION; SIMULATION-BASED;

EID: 70349647012     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3226659     Document Type: Article
Times cited : (28)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.