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Volumn 106, Issue 6, 2009, Pages
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Avalanche photodiode punch-through gain determination through excess noise analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
DEVICE STRUCTURES;
EXCESS NOISE;
MULTIPLICATION GAIN;
NEW APPROACHES;
PERFORMANCE PARAMETERS;
PUNCH-THROUGH;
SEPARATE ABSORPTION AND MULTIPLICATION;
SIMULATION-BASED;
GERMANIUM;
PHOTODIODES;
AVALANCHE PHOTODIODES;
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EID: 70349647012
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3226659 Document Type: Article |
Times cited : (28)
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References (7)
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