Subdiffraction-limited far-field raman spectroscopy of single carbon nanotubes: An unenhanced approach

ACS Nano

Volumn 5, Issue 2, 2011, Pages 1033-1041

  Kaplan Ashiri, Ifat ^a   Titus, Eric J ^a   Willets, Katherine A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

AFM; carbon nanotube; Raman; subdiffraction limited

Indexed keywords

AFM; AFM TIP; ANGLE OF INCIDENCE; ATOMIC FORCE MICROSCOPES; DISORDER BAND; EVANESCENT FIELDS; EXCITATION FIELD; FAR-FIELD; FREQUENCY SHIFT; IN-PLANE; INCIDENT BEAMS; LOCAL CURVATURE; NANOMETER RESOLUTIONS; NEW APPROACHES; PENETRATION DEPTH; RAMAN; RAMAN D-BAND; SINGLE CARBON NANOTUBE; SINGLE NANOTUBES; SPECTROSCOPIC SIGNATURES; STRUCTURAL CHANGE; SUB-DIFFRACTION; TOTAL INTERNAL REFLECTIONS;

ATOMIC SPECTROSCOPY; CARBON NANOTUBES; CHEMICAL PROPERTIES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX;

MULTIWALLED CARBON NANOTUBES (MWCN);

CARBON NANOTUBE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; DIFFUSION; RAMAN SPECTROMETRY;

DIFFUSION; MICROSCOPY, ATOMIC FORCE; NANOTUBES, CARBON; SPECTRUM ANALYSIS, RAMAN;

EID: 79951886991     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn102498h     Document Type: Article

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