Development of a scanning angle total internal reflection Raman spectrometer

Review of Scientific Instruments

Volumn 81, Issue 4, 2010, Pages

  McKee, Kristopher J ^a,b   Smith, Emily A ^a,b  

^a U S DEPARTMENT OF ENERGY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE RESOLUTION; AXIAL RESOLUTIONS; CALIBRATION PARAMETERS; CHARGE COUPLED DEVICE DETECTORS; CHEMICAL SPECIFICITY; CONFOCAL RAMAN MICROSCOPY; CRITICAL ANGLES; DISPERSIVE SPECTROMETERS; EVANESCENT WAVE; FOCAL PLANE; FOCUSING LENS; INCIDENT ANGLES; INCIDENT LASER; INSTRUMENT PLATFORMS; INTERFACIAL PHENOMENA; MICROSCOPE OBJECTIVE; OPTICAL MICROSCOPES; RAMAN SCATTER; RAMAN SPECTROMETERS; SAMPLE LOCATION; SCANNING ANGLES; TOTAL INTERNAL REFLECTIONS; TRANSLATION STAGE; VARIABLE ANGLE OPTICS;

DEPTH PROFILING; MICROSCOPES; REFRACTIVE INDEX; SPECTROMETERS; SPECTROMETRY;

RAMAN SCATTERING;

EID: 77952412682     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3378682     Document Type: Article

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