Raman nanometrology of graphene: Temperature and substrate effects

Solid State Communications

Volumn 149, Issue 27-28, 2009, Pages 1132-1135

  Calizo, Irene ^a   Ghosh, Suchismita ^a   Bao, Wenzhong ^a   Miao, Feng ^a   Ning Lau, Chun ^a   Balandin, Alexander A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

A. Carbon; A. Graphene; A. Nanostructures; E. Raman spectroscopy

Indexed keywords

A-PLANE SAPPHIRE; A. CARBON; A. GRAPHENE; A. NANOSTRUCTURES; CONSISTENT VALUES; E. RAMAN SPECTROSCOPY; GAAS; GRAPHENE; GRAPHENE DEVICES; GRAPHENE LAYERS; MICRO RAMAN SPECTROSCOPY; NANOMETROLOGY; NEGATIVE COEFFICIENTS; PEAK FREQUENCIES; RAMAN SIGNATURES; RAMAN SPECTRA; RAMAN SPECTRUM; RED SHIFT; SUBSTRATE EFFECTS; TEMPERATURE COEFFICIENT; TEMPERATURE DEPENDENCE;

CORUNDUM; GLASS; NANOSTRUCTURES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SAPPHIRE; SPECTRUM ANALYSIS; THERMAL EXPANSION;

SUBSTRATES;

EID: 65849346972     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.01.036     Document Type: Article

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