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Volumn 378-381, Issue I, 2001, Pages 118-123
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WinPLOTR: A windows tool for powder diffraction pattern analysis
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CEA SACLAY
(France)
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Author keywords
Diffraction pattern analysis; Graphical user interface; Rietveld refinement; WinPLOTR
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Indexed keywords
COMPUTER APPLICATIONS;
COMPUTER PROGRAMMING LANGUAGES;
GRAPHICAL USER INTERFACES;
X RAY POWDER DIFFRACTION;
POWDER DIFFRACTION ANALYSIS;
RIETVELD REFINEMENT;
MATERIALS SCIENCE;
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EID: 0035184477
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.378-381.118 Document Type: Conference Paper |
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Times cited : (1768)
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References (9)
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