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Applied Physics A: Materials Science and Processing

Volumn 102, Issue 1, 2011, Pages 69-77

Introduction of Zr in nanometric periodic Mg/Co multilayers

(11) Le Guen, K a Hu, M H a Andre J M a Jonnard, P a Zhou, S K b Li, H C b Zhu, J T b Wang, Z S b Mahne, N c Giglia, A c Nannarone, S c

a SORBONNE UNIVERSITÉ (France)

b TONGJI UNIVERSITY (China)

c IOM CNR LABORATORIO TASC (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EUV REFLECTIVITY; EXTREME UV; GRAZING INCIDENCE; LAYERED SYSTEMS; NANOMETRICS; OPTICAL COMPONENTS; OPTICAL PERFORMANCE; REFLECTANCE VALUES; REFLECTOMETRY MEASUREMENTS; SPECTRAL RANGE; STRUCTURAL QUALITIES; THEORETICAL MODELS;

MULTILAYERS; PERIODIC STRUCTURES; REFLECTION; ZIRCONIUM;

OPTICAL MULTILAYERS;

EID: 79551689276 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-010-6093-2 Document Type: Article

Times cited : (21)

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