Comparison of Mg-based multilayers for solar He II radiation at 30.4nm wavelength

Applied Optics

Volumn 49, Issue 20, 2010, Pages 3922-3925

  Zhu, Jingtao ^a   Zhou, Sika ^a   Li, Haochuan ^a   Huang, Qiushi ^a   Wang, Zhanshan ^a   Le Guen, Karine ^b   Hu, Min Hui ^b   André, Jean Michel ^b   Jonnard, Philippe ^b  

^a TONGJI UNIVERSITY   (China)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; REFLECTION; SILICON CARBIDE; SYNCHROTRON RADIATION;

MAGNETRON SPUTTERING METHOD; MEASURED RESULTS; MULTI-LAYER MIRRORS; NORMAL INCIDENCE; SOLAR IMAGING; X RAY REFLECTION;

MULTILAYERS;

EID: 77955874996     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.003922     Document Type: Article

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