Phenomenological model combining dipoleinteraction signal and background effects for analyzing modulated detection in apertureless scanning near-field optical microscopy

Progress in Electromagnetics Research

Volumn 112, Issue , 2011, Pages 415-440

  Liao, C C ^a   Lo, Y L ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY MODULATION; HETERODYNE DETECTION; OPTICAL DATA STORAGE; OPTICAL MICROSCOPY; SILICON CARBIDE;

APERTURELESS SCANNING; BACKGROUND SIGNALS; DIPOLE INTERACTION; FREQUENCY MODULATED; MODULATION METHODS; NEAR FIELD INTERACTIONS; PHENOMENOLOGICAL MODELING; RESIDUAL STRESS AND STRAINS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 79551640333     PISSN: 10704698     EISSN: 15598985     Source Type: Journal    
DOI: 10.2528/PIER10111007     Document Type: Article

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