Preparation of ceo2/la2zr2o7 buffer layers on textured ni5w substrates by chemical solution deposition method

IEEE Transactions on Applied Superconductivity

Volumn 19, Issue 3, 2009, Pages 3423-3426

  Cheng, Yanling ^a   Suo, Hongli ^a   He, Dong ^a   Zhao, Yue ^a   Gao, Mangmang ^a   Liu, Min ^a   Shuai, Ye ^a   Zhu, Yonghua ^a   Wang, Rong ^a   Ma, Lin ^a   Zhou, Meiling ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Buffer layer; CeO2; Chemical solution deposition

Indexed keywords

AES DEPTH PROFILE; AFM; CEO2; CHEMICAL SOLUTION DEPOSITION; CHEMICAL SOLUTION DEPOSITION METHOD; CRACK FREE; FULL-WIDTH AT HALF MAXIMUMS; HIGH RESOLUTION; ROOT MEAN SQUARE ROUGHNESS; SEM; XRD;

BUFFER LAYERS; CHEMICALS; FULL WIDTH AT HALF MAXIMUM; LANTHANUM; OPTICAL WAVEGUIDES; SUBSTRATES; ZIRCONIUM;

EPITAXIAL LAYERS;

EID: 68749104326     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2009.2018208     Document Type: Conference Paper

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