Clustering and local magnification effects in atom probe tomography: A statistical approach

Microscopy and Microanalysis

Volumn 16, Issue 5, 2010, Pages 643-648

  Philippe, Thomas ^a   Gruber, Maria ^a   Vurpillot, Franois ^a   Blavette, D ^a,b  

^a UNIVERSITÉ DE ROUEN   (France)

^b INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

atom probe tomography; clustering; local magnification effects; nearest neighbor distances

Indexed keywords

EID: 79451471505     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610000449     Document Type: Article

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