A model accounting for spatial overlaps in 3D atom-probe microscopy

Ultramicroscopy

Volumn 89, Issue 1-3, 2001, Pages 145-153

  Blavette, D ^a   Vurpillot, F ^a   Pareige, P ^a   Menand, A ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

Atom probe; Local magnification; Modelling; Phase composition

Indexed keywords

COMPUTER SIMULATION; EVAPORATION; PRECIPITATION (CHEMICAL); SURFACES;

SPATIAL OVERLAPS;

MICROSCOPIC EXAMINATION;

ALLOY; COPPER;

ARTICLE; ATOM; COMPUTER MODEL; COMPUTER SIMULATION; CONTRAST; EVAPORATION; IMAGING; ION TRANSPORT; PARTICLE SIZE; PRECIPITATION; TECHNIQUE;

EID: 0035187958     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(01)00120-6     Document Type: Article

References (14)