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AIP Conference Proceedings

Volumn 1321, Issue , 2010, Pages 298-301

Evaluation of surface damage on organic materials irradiated with Ar cluster ion beam

(6) Yamamoto, Y a Ichiki, K a Ninomiya, S b,c Seki, T a,c Aoki, T a,c Matsuo, J b,c

a KYOTO UNIVERSITY (Japan)

b Quantum Science and Education Center (Japan)

c JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

Ar gas cluster; damage evaluation; FIB; TOF SIMS; XPS

Indexed keywords

EID: 79251581260 PISSN: 0094243X EISSN: 15517616 Source Type: Conference Proceeding
DOI: 10.1063/1.3548386 Document Type: Conference Paper

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.