Cs+ ion beam damage of poly(vinyl chloride) and poly(methyl methacrylate) studied by high mass resolution ToF-SIMS

Surface and Interface Analysis

Volumn 25, Issue 3, 1997, Pages 167-176

  Briggs, D ^a   Fletcher, I W ^a  

^a AKZO NOBEL CENTRAL RESEARCH   (Netherlands)

Author keywords

Ion beam damage; Poly(methyl methacrylate); Poly(vinyl chloride); ToF SIMS

Indexed keywords

ION BEAMS; IONS; POLYMETHYL METHACRYLATES; POLYVINYL CHLORIDES;

BOND BREAKING; HIGH MASS RESOLUTION; ION BEAM DAMAGE; SURFACE POTENTIAL CONTROL; UNCERTAINTIES;

SECONDARY ION MASS SPECTROMETRY;

EID: 0031097851     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199703)25:3<167::aid-sia220>3.0.co;2-j     Document Type: Article

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