Fe:O:C grown by focused-electron-beam-induced deposition: Magnetic and electric properties

Nanotechnology

Volumn 22, Issue 2, 2011, Pages

  Lavrijsen, R ^a   Cordoba R ^b   Schoenaker, F J ^a,b   Ellis, T H ^a   Barcones, B ^a   Kohlhepp, J T ^a   Swagten, H J M ^a   Koopmans, B ^a   De Teresa, J M ^b   Magen C ^b   Ibarra, M R ^b   Trompenaars, P ^c   Mulders, J J L ^c  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF ZARAGOZA   (Spain)

^c Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PARAMETER; C CONTENTS; EFFECT OF OXYGEN; ELECTRON BEAM-INDUCED DEPOSITION; ENERGY DISPERSIVE X-RAY; FE CONTENT; MAGNETIC AND ELECTRIC PROPERTIES; MAGNETIC NANOSTRUCTURES; MAGNETO-OPTICAL KERR EFFECTS; MAGNETO-TRANSPORT MEASUREMENT; MAGNETOTRANSPORTS; ROOM TEMPERATURE; SPINTRONICS DEVICE; TRANSPORT MECHANISM;

DEPOSITS; ELECTRIC PROPERTIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; KERR MAGNETOOPTICAL EFFECT; MAGNETIC FIELD EFFECTS; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MAGNETOS; NANOWIRES; OXYGEN;

OPTICAL KERR EFFECT;

EID: 79251578962     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/2/025302     Document Type: Article

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