Ab-initio calculation of the vibrational influence on hole-trapping

2010 14th International Workshop on Computational Electronics, IWCE 2010

Volumn , Issue , 2010, Pages 163-166

  Schanovsky, Franz ^a   Goes, Wolfgang ^a   Grasser, Tibor ^a  

^a INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATIONS; ATOMISTIC MODELS; ELECTRONIC MATRIX; ELECTRONIC TRANSITION; MOS STRUCTURE; NEGATIVE BIAS TEMPERATURE INSTABILITY; NON-RADIATIVE; OXIDE TRAPS; SHAPE FUNCTIONS; SIMPLE METHOD;

ELECTRONICS ENGINEERING; FUNCTION EVALUATION; IONIC CONDUCTION;

REACTION RATES;

EID: 78751697980     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWCE.2010.5677989     Document Type: Conference Paper

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