Calibration of embedded-cluster method for defect studies in amorphous silica

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 8, 2004, Pages

  Mysovsky, Andrey S ^a,b   Sushko, Peter V ^b   Mukhopadhyay, Sanghamitra ^b   Edwards, Arthur H ^c   Shluger, Alexander L ^b  

^a RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

ACCURACY; ANALYTIC METHOD; ARTICLE; CALCULATION; CALIBRATION; CRYSTAL STRUCTURE; ENERGY; MOLECULAR MODEL; REPRODUCIBILITY;

EID: 1842616156     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.085202     Document Type: Article

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