Effects of barrier height inhomogeneities on the determination of the Richardson constant

Journal of Applied Physics

Volumn 109, Issue 1, 2011, Pages

  Sarpatwari, K ^a   Mohney, S E ^b   Awadelkarim, O O ^c  

^a MICRON TECHNOLOGY INC   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c The Pennsylvania State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL APPROACH; BARRIER HEIGHTS; CURRENT CONDUCTION; CURRENT TRANSPORT; CURRENT VOLTAGE; FUNDAMENTAL CHANGES; INHOMOGENEITIES; LINEAR RELATION; NONIDEAL EFFECTS; RICHARDSON CONSTANT; RICHARDSON PLOT; SCHOTTKY BARRIER CONTACTS; SCHOTTKY BARRIER HEIGHTS; SCHOTTKY DIODES; SIMPLE LINEAR RELATION; THEORETICAL VALUES; V-T CHARACTERISTICS;

CURRENT VOLTAGE CHARACTERISTICS; DIODES; GALLIUM NITRIDE;

SCHOTTKY BARRIER DIODES;

EID: 78751496354     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3530868     Document Type: Article

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