Composition dependent preferential orientation, dielectric and ferroelectric properties of Pb(ZrxTi1-X)O3 thin films derived by sol-gel process

Materials Letters

Volumn 65, Issue 5, 2011, Pages 901-904

  Jegatheesan, P ^a   Yadav, Harish Kumar ^b   Gupta, Vinay ^b   Giridharan, N V ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b UNIVERSITY OF DELHI   (India)

Author keywords

Dielectric; Ferroelectric; PZT; Sol gel; Thin films

Indexed keywords

APPLIED FIELD; COERCIVE FIELD; DIELECTRIC; DIELECTRIC AND FERROELECTRIC PROPERTIES; DIELECTRIC CONSTANT VALUES; DIELECTRIC MEASUREMENTS; DOMAIN SWITCHINGS; FERROELECTRIC; FERROELECTRIC BEHAVIOR; PREFERENTIAL ORIENTATION; PZT; PZT FILM; REMNANT POLARIZATIONS; ROOM TEMPERATURE; SPIN-ON;

FERROELECTRICITY; GELS; LEAD; PERMITTIVITY; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM;

FERROELECTRIC FILMS;

EID: 78651359993     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2010.12.022     Document Type: Article

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