Effect of Zr/Ti ratio on the microstructure and ferroelectric properties of lead zirconate titanate thin films

Materials Chemistry and Physics

Volumn 102, Issue 2-3, 2007, Pages 159-164

  Khaenamkaew, P ^a   Muensit, S ^a   Bdikin, I K ^b   Kholkin, A L ^b  

^a Faculty of Science   (Thailand)

^b UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

Memory effect; PZT film; Sol gel; Zr Ti ratio

Indexed keywords

LEAD COMPOUNDS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; TITANIUM COMPOUNDS; X RAY DIFFRACTION; ZIRCONIUM COMPOUNDS;

CRYSTALLOGRAPHIC STRUCTURE; LEAD ZIRCONATE TITANATE; LOSS FACTOR; METAL ALKOXIDE;

THIN FILMS;

EID: 33847632909     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2006.11.019     Document Type: Article

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