Manufacturing intelligence to exploit the value of production and tool data to reduce cycle time

IEEE Transactions on Automation Science and Engineering

Volumn 8, Issue 1, 2011, Pages 103-111

  Kuo, Chung Jen ^a   Chien, Chen Fu ^a   Chen, Jan Daw ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b MACRONIX INTERNATIONAL CO LTD   (Taiwan)

Author keywords

Cycle time; neural networks (NNs); tool dedication; wafer fabrication; waiting time constraint; work in process (WIP)

Indexed keywords

COMPARISON RESULT; COMPETITIVE ADVANTAGE; CRITICAL INPUTS; CYCLE TIME; CYCLE TIME REDUCTION; EMPIRICAL DATA; LITTLE RESEARCH; LITTLE'S LAW; PRODUCTION DATA; QUEUEING MODEL; SEMICONDUCTOR COMPANIES; SEMICONDUCTOR INDUSTRY; SEMICONDUCTOR WAFER FABRICATION; TOOLSETS; WAFER FABRICATIONS; WAITING-TIME; WORK-IN-PROCESS;

COMPETITION; EQUIPMENT; FABRICATION; FORECASTING; INDUSTRY; NEURAL NETWORKS; QUEUEING THEORY; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON WAFERS;

DATA REDUCTION;

EID: 78651071873     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2010.2040999     Document Type: Article

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