Potential profiling of the nanometer-scale charge-depletion layer in n-ZnO/p-NiO junction using photoemission spectroscopy

Applied Physics Letters

Volumn 89, Issue 15, 2006, Pages

  Ishida, Yukiaki ^c   Fujimori, Atsushi ^c   Ohta, Hiromichi ^a,b   Hirano, Masahiro ^b   Hosono, Hideo ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CONSERVATION; CHARGE-DEPLETION WIDTH; ION SPUTTERING; PHOTOEMISSION SPECTROSCOPY;

ELECTRON ENERGY LEVELS; NANOSTRUCTURED MATERIALS; PHOTOEMISSION; SPECTROSCOPIC ANALYSIS; SPUTTERING; ZINC OXIDE;

SEMICONDUCTOR JUNCTIONS;

EID: 33749992954     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2358858     Document Type: Article

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