SCOPUS 정보 검색 플랫폼

Journal of Electronic Materials

Volumn 40, Issue 1, 2011, Pages 35-41

Microstructure, electrical properties, and electrochemical migration of a directly printed ag pattern

(5) Noh, Bo In a Yoon, Jeong Won a Kim, Kwang Seok a Lee, Young Chul a Jung, Seung Boo a

a Sungkyunkwan University (South Korea)

Author keywords

Ag nanopaste; electrical resistivity; electrochemical migration; screen printing; silicon substrate; sintering

Indexed keywords

AG ELECTRODE; AG FILMS; AG NANOPASTE; CLUSTER SIZES; ELECTRICAL CHARACTERISTIC; ELECTRICAL PROPERTY; ELECTRICAL RESISTIVITY; ELECTROCHEMICAL MIGRATION; HIGH TEMPERATURE; SCREEN PRINTING METHODS; SI SUBSTRATES; SILICON SUBSTRATE; SILICON SUBSTRATES; SINTERING CONDITION; SINTERING PROCESS; SINTERING TEMPERATURES;

ELECTRIC CONDUCTIVITY; ELECTROCHEMICAL PROPERTIES; MICROSTRUCTURE; PRINTING PRESSES; SCREEN PRINTING; SILVER; SUBSTRATES;

SINTERING;

EID: 78650736677 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-010-1408-9 Document Type: Article

Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.