Comparing migratory resistive short formation abilities of conductor systems applied in advanced interconnection systems

Microelectronics Reliability

Volumn 41, Issue 2, 2001, Pages 229-237

  Harsányi, Gábor ^a   Inzelt, George ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CYCLIC VOLTAMMETRY; INTERCONNECTION NETWORKS; LIFE CYCLE; SHORT CIRCUIT CURRENTS; STRESS ANALYSIS;

ELECTROANALYTICAL CHEMISTRY; HIGH-DENSITY INTERCONNECTION SYSTEMS;

MICROELECTRONICS;

EID: 0343408455     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00093-7     Document Type: Article

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