New types of reliability problems in porous ceramic based microdevices

Materials Chemistry and Physics

Volumn 44, Issue 1, 1996, Pages 85-89

  Harsányi, Gábor ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

Electrochemical migration; Material design aspects; Porous ceramic based microdevices

Indexed keywords

CERAMIC MATERIALS; ELECTROMIGRATION; IONS; METALS; MODELS; RELIABILITY;

CONDUCTOR INSULATOR STRUCTURE; ELECTROCHEMICAL MIGRATION; MATERIAL DESIGN ASPECTS; MICROCIRCUITS; MIGRATORY FAILURES; POROUS CERAMIC BASED MICRODEVICES; SHORT CIRCUIT GROWTH;

MICROELECTRONICS;

EID: 0030130218     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/0254-0584(95)01646-C     Document Type: Article

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