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Volumn , Issue , 2000, Pages 1666-1673
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New method for comparing migration abilities of conductor systems based on conventional electroanalytical techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
CYCLIC VOLTAMMETRY;
ELECTROCHEMISTRY;
MATHEMATICAL MODELS;
METALLIZING;
ACCELERATED CLIMATIC TESTS;
ELECTROANALYTICAL TECHNIQUE;
MIGRATION ABILITY;
WATER DROP TEST;
ELECTRIC CONDUCTORS;
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EID: 0034476756
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (27)
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