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Volumn 100, Issue 4, 2010, Pages 1007-1012

The resistance of single atomic steps in ultrathin Pb nanowires on Si(557)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC HEIGHTS; ATOMIC STEP; CONDUCTING PATHS; DIRECT WRITING; ELECTRONIC TRANSPORT PROPERTIES; EXCESS PB; LOCAL SCATTERING; ORDER OF MAGNITUDE; PB FILM; PB NANOWIRE; POTENTIOMETRY; STEP EDGE; TUNNELING MICROSCOPES; ULTRA-THIN;

EID: 78650435397     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-010-5902-y     Document Type: Article
Times cited : (7)

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