Electromigration and potentiometry measurements of single-crystalline Ag nanowires under UHV conditions

Journal of Physics Condensed Matter

Volumn 21, Issue 26, 2009, Pages

  Kaspers, M R ^a   Bernhart, A M ^a   Meyer Zu Heringdorf, F J ^a   Dumpich, G ^a   Moller R ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AG NANOWIRES; FOUR-PROBE; IN-SITU; POTENTIOMETRY; SCANNING ELECTRON MICROSCOPES; SCANNING TUNNELLING MICROSCOPES; SELF-ORGANIZATIONS; SEM; SI(001) SURFACES; SINGLE-CRYSTALLINE;

CRYSTALLINE MATERIALS; MICROSCOPES; NANOWIRES; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SCANNING ELECTRON MICROSCOPY; SILVER; ULTRAHIGH VACUUM;

ELECTROMIGRATION;

EID: 77953521597     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/26/265601     Document Type: Article

References (16)

1. Ho P 1989 Rep. Prog. Phys. 52 301-48
2. Pierce D G 1997 Microelectron. Reliab. 37 1053-72
3. Tu K N 2003 J. Appl. Phys. 94 5451
4. Sorbello R S 1988 Solid State Physics vol 51 (New York: Academic) p159
5. Stahlmecke B, Chelaru L, Meyer zu Heringdorf F-J and Dumpich G 2006 AIP Conf. Proc. 817 65-70
6. Arzt E, Kraft O, Nix W D and Sanchez J E 1994 J. Appl. Phys. 76 1563
7. Shingubara S, Nakasaki Y and Kaneko H 1991 Appl. Phys. Lett. 58 42
8. Yoo Y-C and Thompson C V 1997 J. Appl. Phys. 81 6062
9. Roos K R, Roos K L, Horn-von Hoegen M and Meyer zu Heringdorf F-J 2005 J. Phys.: Condens. Matter 17 1407
10. Stahlmecke B, Meyer zu Heringdorf F-J, Chelaru L, Horn-von Hoegen M, Dumpich G and Roos K R 2006 Appl. Phys. Lett. 88 053122
11. Tersoff J and Tromp R M 1993 Phys. Rev. Lett. 70 2782
12. Fölsch S, Winau D, Meyer G, Rieder K H, Horn-von Hoegen M, Schmidt T and Henzler M 1995 Appl. Phys. Lett. 67 2185
13. Kury P, Hild R, Thien D, Günter H, Meyer zu Heringdorf F-J and Horn-von Hoegen M 2005 Rev. Sci. Instrum. 76 083906
14. Giancoli D C 2006 Physik (Munich: Pearson Studium)
15. Stahlmecke B and Dumpich G 2007 J. Phys.: Condens. Matter 19 046210
16. Shi F X, Yao W Q, Cao L L and Dong Y H 1997 J. Mater. Sci. Lett. 16 1205-7