Anomalous thickness dependence of the Hall effect in ultrathin Pb layers on Si(111)

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 24, 2002, Pages 2413061-2413064

  Vilfan, I ^a,b   Henzler, M ^a   Pfennigstorf, O ^a   Pfnurl H ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

LEAD; SILICON;

ARTICLE; CALCULATION; CONDUCTANCE; ELECTRICITY; ENERGY; MAGNETISM; OSCILLATION; STRUCTURE ANALYSIS; SURFACE PROPERTY; THICKNESS;

EID: 0037116026     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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