Catastrophic optical damage at front and rear facets of diode lasers

Applied Physics Letters

Volumn 97, Issue 23, 2010, Pages

  Hempel, Martin ^a   Tomm, Jens W ^a   Ziegler, Mathias ^b   Elsaesser, Thomas ^a   Michel, Nicolas ^c   Krakowski, Michel ^c  

^a MAX BORN INSTITUT   (Germany)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c ALCATEL THALES III V LAB   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AL-FREE; AUGER RECOMBINATION PROCESS; CARRIER DENSITY; CATASTROPHIC OPTICAL DAMAGES; DIODE LASERS; FACET HEATING; IN-SITU; LASER LIGHTS; SINGLE-PULSE; SURFACE RECOMBINATIONS;

HEATING; SEMICONDUCTOR LASERS;

ALUMINUM;

EID: 78650370252     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3524235     Document Type: Article

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