Fault protection of broad-area laser diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7198, Issue , 2009, Pages

  Jacob, J H ^a   Petr, R ^a   Jaspan, M A ^a   Swartz, S D ^a   Knapczyk, M T ^a   Flusberg, A M ^a   Chin, A K ^b   Smilanski, I ^a  

^a Science Research Laboratory Inc   (United States)

^b Aland Chin LLC   (United States)

Author keywords

Broad area laser diode; COD; Fault protection; Reliability

Indexed keywords

AGING TESTS; BROAD-AREA LASER-DIODE; COD; CONSTANT CURRENT; CUT-OFF; DEVICE FAILURES; DIODE BARS; ELECTRICAL TRANSIENTS; FAULT-PROTECTION; GAAS; HIGH-POWER; LASER DIODES; OPERATING CURRENTS; OPTICAL WINDOW; UNPROTECTED DEVICES;

FAULT DETECTION; LASERS; RELIABILITY; TESTING; TRANSIENTS;

DIODES;

EID: 65649091396     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.807717     Document Type: Conference Paper

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