SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 96, Issue 25, 2010, Pages

Time-resolved analysis of catastrophic optical damage in 975 nm emitting diode lasers

(6) Hempel, Martin a Ziegler, Mathias b Tomm, Jens W a Elsaesser, Thomas a Michel, Nicolas c Krakowski, Michel c

a MAX BORN INSTITUT (Germany)

b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING (Germany)

c ALCATEL THALES III V LAB (France)

Author keywords

[No Author keywords available]

Indexed keywords

CATASTROPHIC OPTICAL DAMAGES; CURRENT PULSE; DIODE LASERS; ORDER OF MAGNITUDE; POWER TRANSIENT; SPATIAL MOTIONS; THERMAL IMAGES; TIME CONSTANTS; TIME-RESOLVED ANALYSIS; WAVELENGTH DEVICES;

SEMICONDUCTOR LASERS;

EID: 77954065908 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3456388 Document Type: Article

Times cited : (21)

References (18)

1
- 0018470486
- xas double-heterostructure laser material
- DOI 10.1063/1.326278
- C. H. Henry, P. M. Petroff, R. A. Logan, and F. R. Merritt, J. Appl. Phys. JAPIAU 0021-8979 50, 3721 (1979). 10.1063/1.326278 (Pubitemid 10470011)
- (1979) Journal of Applied Physics , vol.50 , Issue.5 , pp. 3721-3732
- Henry, C.H.¹ Petroff, P.M.² Logan, R.A.³ Merritt, F.R.⁴

2
- 0028711036
- IEEE, Oct. 31-Nov. 3
- A. Oosenbrug and E. E. Latta, Lasers and Electro-Optics Society Annual Meeting, 1994, LEOS Conference Proceedings. IEEE, Oct. 31-Nov. 3, Vol. 2, pp. 37-38.
- (1994) Lasers and Electro-Optics Society Annual Meeting, LEOS Conference Proceedings , vol.2 , pp. 37-38
- Oosenbrug, A.¹ Latta, E.E.²

3
- 0001693104
- Simple method for examining sulphur passivation of facets in InGaAs-AlGaAs (λ=0.98 μm) laser diodes
- DOI 10.1063/1.115822, PII S0003695196009189
- G. Beister, J. Maege, D. Gutsche, G. Erbert, J. Sebastian, K. Vogel, M. Weyers, J. Wurfl, and O. P. Daga, Appl. Phys. Lett. APPLAB 0003-6951 68, 2467 (1996). 10.1063/1.115822 (Pubitemid 126683943)
- (1996) Applied Physics Letters , vol.68 , Issue.18 , pp. 2467-2468
- Beister, G.¹ Maege, J.² Gutsche, D.³ Erbert, G.⁴ Sebastian, J.⁵ Vogel, K.⁶ Weyers, M.⁷ Wurfl, J.⁸ Daga, O.P.⁹

4
- 18944377635
- Novel passivation process for the mirror facets of Al-free active-region high-power semiconductor diode lasers
- DOI 10.1109/LPT.2005.846750
- P. Ressel, G. Erbert, U. Zeimer, K. Hausler, G. Beister, B. Sumpf, A. Klehr, and G. Trankle, IEEE Photonics Technol. Lett. IPTLEL 1041-1135 17, 962 (2005). 10.1109/LPT.2005.846750 (Pubitemid 40699840)
- (2005) IEEE Photonics Technology Letters , vol.17 , Issue.5 , pp. 962-964
- Ressel, P.¹ Erbert, G.² Zeimer, U.³ Hausler, K.⁴ Beister, G.⁵ Sumpf, B.⁶ Klehr, A.⁷ Trankle, G.⁸

5
- 0001702478
- JAPIAU 0021-8979. 10.1063/1.363664
- L. W. Tu, E. F. Schubert, M. Hong, and G. J. Zydzik, J. Appl. Phys. JAPIAU 0021-8979 80, 6448 (1996). 10.1063/1.363664
- (1996) J. Appl. Phys. , vol.80 , pp. 6448
- Tu, L.W.¹ Schubert, E.F.² Hong, M.³ Zydzik, G.J.⁴

6
- 65649087963
- PSISDG 0277-786X
- I. B. Petrescu-Prahova, P. Modak, E. Goutain, D. Silan, D. Bambrick, J. Riordan, T. Moritz, S. D. McDougall, B. Qiu, and J. H. Marsh, Proc. SPIE PSISDG 0277-786X 7198, 71981I (2009).
- (2009) Proc. SPIE , vol.7198
- Petrescu-Prahova, I.B.¹ Modak, P.² Goutain, E.³ Silan, D.⁴ Bambrick, D.⁵ Riordan, J.⁶ Moritz, T.⁷ McDougall, S.D.⁸ Qiu, B.⁹ Marsh, J.H.¹⁰

7
- 0039427680
- JAPIAU 0021-8979. 10.1063/1.334350
- W. Nakwaski, J. Appl. Phys. JAPIAU 0021-8979 57, 2424 (1985). 10.1063/1.334350
- (1985) J. Appl. Phys. , vol.57 , pp. 2424
- Nakwaski, W.¹

8
- 0029759066
- Optical strength of semiconductor laser materials
- DOI 10.1016/0079-6727(95)00002-X
- P. G. Eliseev, Prog. Quantum Electron. PQUEAH 0079-6727 20, 1 (1996). 10.1016/0079-6727(95)00002-X (Pubitemid 126404275)
- (1996) Progress in Quantum Electronics , vol.20 , Issue.1 , pp. 1-82
- Eliseev, P.G.¹

9
- 0000906064
- JAPIAU 0021-8979. 10.1063/1.373538
- W. R. Smith, J. Appl. Phys. JAPIAU 0021-8979 87, 8276 (2000). 10.1063/1.373538
- (2000) J. Appl. Phys. , vol.87 , pp. 8276
- Smith, W.R.¹

10
- 65749105564
- QUELEZ 1063-7818. 10.1070/QE2008v038n11ABEH013866
- D. R. Miftakhutdinov, I. V. Akimova, A. P. Bogatov, T. I. Gushchik, A. E. Drakin, N. V. D'Yachkov, V. V. Popovichev, and A. P. Nekrasov, Quantum Electron. QUELEZ 1063-7818 38, 993 (2008). 10.1070/QE2008v038n11ABEH013866
- (2008) Quantum Electron. , vol.38 , pp. 993
- Miftakhutdinov, D.R.¹ Akimova, I.V.² Bogatov, A.P.³ Gushchik, T.I.⁴ Drakin, A.E.⁵ D'Yachkov, N.V.⁶ Popovichev, V.V.⁷ Nekrasov, A.P.⁸

11
- 65649091396
- PSISDG 0277-786X
- J. H. Jacob, R. Petr, M. A. Jaspan, S. D. Swartz, M. T. Knapczyk, and A. M. Flusberg, Proc. SPIE PSISDG 0277-786X 7198, 719815 (2009).
- (2009) Proc. SPIE , vol.7198 , pp. 719815
- Jacob, J.H.¹ Petr, R.² Jaspan, M.A.³ Swartz, S.D.⁴ Knapczyk, M.T.⁵ Flusberg, A.M.⁶

12
- 67049156198
- APPLAB 0003-6951. 10.1063/1.3133339
- M. Ziegler, J. W. Tomm, D. Reeber, T. Elsaesser, U. Zeimer, H. E. Larsen, P. M. Petersen, and P. E. Andersen, Appl. Phys. Lett. APPLAB 0003-6951 94, 191101 (2009). 10.1063/1.3133339
- (2009) Appl. Phys. Lett. , vol.94 , pp. 191101
- Ziegler, M.¹ Tomm, J.W.² Reeber, D.³ Elsaesser, T.⁴ Zeimer, U.⁵ Larsen, H.E.⁶ Petersen, P.M.⁷ Andersen, P.E.⁸

13
- 40849141087
- Real-time thermal imaging of catastrophic optical damage in red-emitting high-power diode lasers
- DOI 10.1063/1.2898202
- M. Ziegler, J. W. Tomm, T. Elsaesser, C. Matthiesen, M. Bou Sanayeh, and P. Brick, Appl. Phys. Lett. APPLAB 0003-6951 92, 103514 (2008). 10.1063/1.2898202 (Pubitemid 351394022)
- (2008) Applied Physics Letters , vol.92 , Issue.10 , pp. 103514
- Ziegler, M.¹ Tomm, J.W.² Elsaesser, T.³ Matthiesen, C.⁴ Bou Sanayeh, M.⁵ Brick, P.⁶

14
- 77954204096
- Time resolved studies of catastrophic optical mirror damage in red emitting laser diodes
- JAPIAU 0021-8979 (to be published)
- S. N. Elliott, P. M. Smowton, M. Ziegler, J. W. Tomm, and U. Zeimer, " Time resolved studies of catastrophic optical mirror damage in red emitting laser diodes.," J. Appl. Phys. JAPIAU 0021-8979 (to be published).
- J. Appl. Phys.
- Elliott, S.N.¹ Smowton, P.M.² Ziegler, M.³ Tomm, J.W.⁴ Zeimer, U.⁵

15
- 0021122106
- Formation of optically induced catastrophic degradation lines in InGaAsP EPILayers
- DOI 10.1063/1.94570
- S. Mahajan, H. Temkin, and R. A. Logan, Appl. Phys. Lett. APPLAB 0003-6951 44, 119 (1984). 10.1063/1.94570 (Pubitemid 14589518)
- (1984) Applied Physics Letters , vol.44 , Issue.1 , pp. 119-121
- Mahajan, S.¹ Temkin, H.² Logan, R.A.³

16
- 0039612021
- JAPIAU 0021-8979. 10.1063/1.340100
- S. N. G. Chu, S. Nakahara, M. E. Twigg, L. A. Koszi, E. J. Flynn, A. K. Chin, B. P. Segner, and W. D. Johnston, J. Appl. Phys. JAPIAU 0021-8979 63, 611 (1988). 10.1063/1.340100
- (1988) J. Appl. Phys. , vol.63 , pp. 611
- Chu, S.N.G.¹ Nakahara, S.² Twigg, M.E.³ Koszi, L.A.⁴ Flynn, E.J.⁵ Chin, A.K.⁶ Segner, B.P.⁷ Johnston, W.D.⁸

17
- 0346883669
- JAPIAU 0021-8979. 10.1063/1.335576
- O. Ueda, K. Wakao, S. Komiya, A. Yamaguchi, S. Isozumi, and I. Umebu, J. Appl. Phys. JAPIAU 0021-8979 58, 3996 (1985). 10.1063/1.335576
- (1985) J. Appl. Phys. , vol.58 , pp. 3996
- Ueda, O.¹ Wakao, K.² Komiya, S.³ Yamaguchi, A.⁴ Isozumi, S.⁵ Umebu, I.⁶

18
- 0029342797
- APPLAB 0003-6951. 10.1063/1.114545
- C. W. Snyder, J. W. Lee, R. Hull, and R. A. Logan, Appl. Phys. Lett. APPLAB 0003-6951 67, 488 (1995). 10.1063/1.114545
- (1995) Appl. Phys. Lett. , vol.67 , pp. 488
- Snyder, C.W.¹ Lee, J.W.² Hull, R.³ Logan, R.A.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.