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Volumn 57, Issue 6 PART 1, 2010, Pages 3163-3168

Theoretical correlation of broad spectrum neutron sources for accelerated soft error testing

Author keywords

Accelerated soft error testing; cosmic rays; neutron beams; single event upset; terrestrial neutrons

Indexed keywords

BROAD SPECTRUM; CRITICAL CHARGE; HIGH-ENERGY NEUTRON; NEUTRON SPECTRA; SINGLE EVENT UPSETS; SOFT ERROR; TERRESTRIAL NEUTRONS;

EID: 78650364505     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2010.2086078     Document Type: Conference Paper
Times cited : (33)

References (25)
  • 1
    • 77954030094 scopus 로고    scopus 로고
    • Impact of scaling on neutron-induced soft error in SRAMs from a 250 nm to a 22 nm design rule
    • Jul.
    • E. Ibe, H. Taniguchi, Y. Yahagi, K. S. Shimbo, and T. Toba, "Impact of scaling on neutron-induced soft error in SRAMs from a 250 nm to a 22 nm design rule," IEEE Trans. Electron Devices, vol. 57, no. 7, pp. 1527-1538, Jul. 2010.
    • (2010) IEEE Trans. Electron Devices , vol.57 , Issue.7 , pp. 1527-1538
    • Ibe, E.1    Taniguchi, H.2    Yahagi, Y.3    Shimbo, K.S.4    Toba, T.5
  • 3
    • 1242265198 scopus 로고    scopus 로고
    • Correlation of neutron dosimetry using a silicon equivalent proportional counter microdosimeter and SRAM SEU cross sections for eight neutron energy spectra
    • Dec.
    • B. Gersey, R. Wilkins, H. Huff, R. C. Dwivedi, B. Takala, J. O'Donnell, S. A. Wender, and R. C. Singleterry, Jr, "Correlation of neutron dosimetry using a silicon equivalent proportional counter microdosimeter and SRAM SEU cross sections for eight neutron energy spectra," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2363-2366, Dec. 2003.
    • (2003) IEEE Trans. Nucl. Sci. , vol.50 , Issue.6 , pp. 2363-2366
    • Gersey, B.1    Wilkins, R.2    Huff, H.3    Dwivedi, R.C.4    Takala, B.5    O'Donnell, J.6    Wender, S.A.7    Singleterry Jr., R.C.8
  • 9
  • 10
    • 77957917764 scopus 로고    scopus 로고
    • Fidelity of energy spectra at neutron facilities for single-event effects testing
    • Anaheim, CA, May
    • S. A. Platt, A. V. Prokofiev, and C. X. Xiao, "Fidelity of energy spectra at neutron facilities for single-event effects testing," in Proc. 48th IEEE Int. Rel. Phys. Symp., Anaheim, CA, May 2010, pp. 411-415.
    • (2010) Proc. 48th IEEE Int. Rel. Phys. Symp. , pp. 411-415
    • Platt, S.A.1    Prokofiev, A.V.2    Xiao, C.X.3
  • 12
    • 69549102064 scopus 로고    scopus 로고
    • SEU rates in atmospheric environments: Variations due to cross section fits and environment models
    • Aug.
    • A. Hands, C. S. Dyer, and F. Lei, "SEU rates in atmospheric environments: Variations due to cross section fits and environment models," IEEE Trans. Nucl. Sci., vol. 56, no. 4, pp. 2026-2034, Aug. 2009.
    • (2009) IEEE Trans. Nucl. Sci. , vol.56 , Issue.4 , pp. 2026-2034
    • Hands, A.1    Dyer, C.S.2    Lei, F.3
  • 13
    • 8344278142 scopus 로고    scopus 로고
    • An experimental study of single-event effects induced in commercial SRAMs by neutrons and protons from thermal energies to 500 MeV
    • Oct.
    • C. S. Dyer, S. N. Clucas, C. Sanderson, A. D. Frydland, and R. T. Green, "An experimental study of single-event effects induced in commercial SRAMs by neutrons and protons from thermal energies to 500 MeV," IEEE Trans. Nucl. Sci., vol. 51, no. 5, pp. 2817-2824, Oct. 2004.
    • (2004) IEEE Trans. Nucl. Sci. , vol.51 , Issue.5 , pp. 2817-2824
    • Dyer, C.S.1    Clucas, S.N.2    Sanderson, C.3    Frydland, A.D.4    Green, R.T.5
  • 15
    • 11044227167 scopus 로고    scopus 로고
    • Analysis of proton/neutron SEU sensitivity of commercial SRAMs-application to the terrestrial environment test method
    • Dec.
    • J. Baggio, V. Ferlet-Cavrois, H. Duarte, and O. Flament, "Analysis of proton/neutron SEU sensitivity of commercial SRAMs-application to the terrestrial environment test method," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3420-3426, Dec. 2004.
    • (2004) IEEE Trans. Nucl. Sci. , vol.51 , Issue.6 , pp. 3420-3426
    • Baggio, J.1    Ferlet-Cavrois, V.2    Duarte, H.3    Flament, O.4
  • 16
    • 33846290255 scopus 로고    scopus 로고
    • Neutroninduced single event effects testing across a wide range of energies and facilities and implications for standards
    • Dec.
    • C. Dyer, A. Hands, K. Ford, A. Frydland, and P. Truscott, "Neutroninduced single event effects testing across a wide range of energies and facilities and implications for standards," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3596-3601, Dec. 2006.
    • (2006) IEEE Trans. Nucl. Sci. , vol.53 , Issue.6 , pp. 3596-3601
    • Dyer, C.1    Hands, A.2    Ford, K.3    Frydland, A.4    Truscott, P.5
  • 18
    • 53349156724 scopus 로고    scopus 로고
    • Charge-collection and single-event upset measurements at the ISIS neutron source
    • Aug.
    • S. Platt, Z. Torok, C. Frost, and S. Ansell, "Charge-collection and single-event upset measurements at the ISIS neutron source," IEEE Trans. Nucl. Sci., vol. 55, no. 4, pp. 2126-2132, Aug. 2008.
    • (2008) IEEE Trans. Nucl. Sci. , vol.55 , Issue.4 , pp. 2126-2132
    • Platt, S.1    Torok, Z.2    Frost, C.3    Ansell, S.4
  • 21
    • 29144451014 scopus 로고    scopus 로고
    • Versatility of SEU function and its derivation from the irradiation tests with well-defined white neutron beams
    • Oct.
    • Y. Yahagi, E. Ibe, S. Yamamoto, Y. Yoshino, M. Sato, Y. Takahashi, H. Kameyama, A. Saito, and M. Hidaka, "Versatility of SEU function and its derivation from the irradiation tests with well-defined white neutron beams," IEEE Trans. Nucl. Sci., vol. 52, no. 5, pp. 1562-1567, Oct. 2005.
    • (2005) IEEE Trans. Nucl. Sci. , vol.52 , Issue.5 , pp. 1562-1567
    • Yahagi, Y.1    Ibe, E.2    Yamamoto, S.3    Yoshino, Y.4    Sato, M.5    Takahashi, Y.6    Kameyama, H.7    Saito, A.8    Hidaka, M.9
  • 22
    • 37249023738 scopus 로고    scopus 로고
    • Single event upsets induced by 1-10 MeV neutrons in static-RAMs using mono-energetic neutron sources
    • Dec.
    • J. Baggio, D. Lambert, V. Ferlet-Cavrois, P. Paillet, C. Marcandella, and O. Duhamel, "Single event upsets induced by 1-10 MeV neutrons in static-RAMs using mono-energetic neutron sources," IEEE Trans. Nucl. Sci., vol. 54, no. 6, pp. 2149-2155, Dec. 2007.
    • (2007) IEEE Trans. Nucl. Sci. , vol.54 , Issue.6 , pp. 2149-2155
    • Baggio, J.1    Lambert, D.2    Ferlet-Cavrois, V.3    Paillet, P.4    Marcandella, C.5    Duhamel, O.6
  • 23
    • 33748347316 scopus 로고    scopus 로고
    • Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications
    • Aug.
    • D. Lambert et al., "Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications," IEEE Trans. Nucl. Sci., vol. 53, no. 4, pp. 1890-1896, Aug. 2006.
    • (2006) IEEE Trans. Nucl. Sci. , vol.53 , Issue.4 , pp. 1890-1896
    • Lambert, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.