메뉴 건너뛰기




Volumn 2003-January, Issue , 2003, Pages 149-155

Improved capabilities for proton and neutron irradiations at TRIUMF

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; COSMOLOGY; IRRADIATION; NEUTRON BEAMS; NEUTRONS; RADIATION EFFECTS; RADIATION HARDENING;

EID: 84952760034     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2003.1281368     Document Type: Conference Paper
Times cited : (99)

References (14)
  • 1
    • 0034504425 scopus 로고    scopus 로고
    • Operation of the TRIUMF (20-500 MeV) proton irradiation facility
    • E. W. Blackmore, "Operation of the TRIUMF (20-500 MeV) proton irradiation facility," IEEE Radiation Effects Dose Workshop, pp 1-5, 2000.
    • (2000) IEEE Radiation Effects Dose Workshop , pp. 1-5
    • Blackmore, E.W.1
  • 2
    • 0033332609 scopus 로고    scopus 로고
    • Single event upset characterization of the pentium® MMX and pentium® II microprocessors using proton irradiation
    • Dec.
    • D. Hiemstra and A. Baril, "Single event upset characterization of the pentium® MMX and pentium® II microprocessors using proton irradiation", IEEE Trans. on Nucl. Sci., vol. 46, no. 6, pp. 1453-1460, Dec. 1999.
    • (1999) IEEE Trans. on Nucl. Sci. , vol.46 , Issue.6 , pp. 1453-1460
    • Hiemstra, D.1    Baril, A.2
  • 3
    • 84952825576 scopus 로고    scopus 로고
    • Stress Synergy in Proton Induced Single Event Effects in SRAM
    • Nov.
    • L. S. Erhardt, T. Cousins, and D. Estan "Stress Synergy in Proton Induced Single Event Effects in SRAM", DREO Internal Report, Nov. 2001.
    • (2001) DREO Internal Report
    • Erhardt, L.S.1    Cousins, T.2    Estan, D.3
  • 5
    • 85008035292 scopus 로고    scopus 로고
    • Proton Radiation Effects in XC4036XLA Field Programmable Gate Arrays
    • Apr.
    • N. J. Buchanan and D. M. Gingrich, "Proton Radiation Effects in XC4036XLA Field Programmable Gate Arrays", IEEE Trans. on Nucl. Sci., vol. 50, no. 2, p. 263, Apr. 2003.
    • (2003) IEEE Trans. on Nucl. Sci. , vol.50 , Issue.2 , pp. 263
    • Buchanan, N.J.1    Gingrich, D.M.2
  • 10
    • 0003444176 scopus 로고    scopus 로고
    • International Commission on Radiological Protection
    • 74, Pergamon Press
    • "International Commission on Radiological Protection", ICRP Pub. 74, Pergamon Press (1997).
    • (1997) ICRP Pub.
  • 11
    • 0036923569 scopus 로고    scopus 로고
    • Neutron-Induced Soft Errors, Latchup, and Comparison of SER Test Methods for SRAM Technologies
    • Dec.
    • P. E. Dodd, M. R. Shaneyfelt, J. R. Schwank, and G. L. Hash, "Neutron-Induced Soft Errors, Latchup, and Comparison of SER Test Methods for SRAM Technologies," IEDM Tech. Digest, pp. 333-336, Dec. 2002.
    • (2002) IEDM Tech. Digest , pp. 333-336
    • Dodd, P.E.1    Shaneyfelt, M.R.2    Schwank, J.R.3    Hash, G.L.4
  • 14
    • 0035127652 scopus 로고    scopus 로고
    • Neutron-induced boron fission as a major source of soft errors in high density SRAMs
    • R. C. Baumann and E. B. Smith, "Neutron-induced boron fission as a major source of soft errors in high density SRAMs," Microelectronics Reliability, vol. 41, pp. 211-218, 2001.
    • (2001) Microelectronics Reliability , vol.41 , pp. 211-218
    • Baumann, R.C.1    Smith, E.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.