Effects of angle of incidence on proton and neutron-induced single-event latchup

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3122-3131

  Schwank, J R ^a,b   Shaneyfelt, M R ^a,b   Baggio, J ^a,c   Dodd, P E ^a,b   Felix, J A ^a,b   Ferlet Cavrois, V ^a,c   Paillet, P ^a,c   Lum, G K ^a,d   Girard, S ^c   Blackmore, E ^a,e  

^a IEEE   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c CEA DIF   (France)

^d LOCKHEED MARTIN   (United States)

^e TRIUMF   (Canada)

Author keywords

Hardness assurance; Proton radiation effects; Single event effects; Single event latchup

Indexed keywords

ANGLE OF INCIDENCE; PROTON ENERGIES; SINGLE-EVENT EFFECTS; SINGLE-EVENT LATCHUP (SEL);

COMPUTER SIMULATION; ELECTRIC POTENTIAL; ENERGY TRANSFER; HARDNESS; NEUTRONS; SCATTERING; STATIC RANDOM ACCESS STORAGE; THERMAL EFFECTS;

PROTONS;

EID: 33846315975     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.884059     Document Type: Conference Paper

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