Single event upsets induced by 1-10 MeV neutrons in static-RAMs using mono-energetic neutron sources

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2149-2155

  Baggio, J ^a,b   Lambert, D ^a,c   Ferlet Cavrois, V ^a,b   Paillet, P ^a,b   Marcandella, C ^b   Duhamel, O ^b  

^a IEEE   (France)

^b CEA/DIF   (France)

^c AIRBUS GROUP INNOVATIONS   (Germany)

Author keywords

Neutron; SEU; SOI; SRAM

Indexed keywords

BULK TECHNOLOGIES; MONOENERGETIC NEUTRON BEAMS;

NEUTRON BEAMS; STATIC RANDOM ACCESS STORAGE;

NEUTRON SOURCES;

EID: 37249023738     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.910039     Document Type: Conference Paper

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