A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility

IEEE Transactions on Nuclear Science

Volumn 54, Issue 4, 2007, Pages 1184-1189

  Violante, M ^a   Sterpone, L ^a   Manuzzato, A ^b   Gerardin, S ^b   Rech, P ^b   Bagatin, M ^b   Paccagnella, A ^b   Andreani, C ^c   Gorini, G ^d   Pietropaolo, A ^c   Cardarilli, G ^c   Pontarelli, S ^c   Frost, C ^e  

^a POLITECNICO DI TORINO   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

^c UNIVERSITY OF ROME TOR VERGATA   (Italy)

^d UNIVERSITY OF MILANO BICOCCA   (Italy)

^e RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

FPGA; Neutron source; Radiation testing; Single event upset (SEU)

Indexed keywords

ISLS BEAM; RADIATION TESTING; SINGLE EVENT UPSET (SEU); SOFT ERROR STUDIES;

COMPUTER HARDWARE; COMPUTER SOFTWARE; HEAVY IONS; NEUTRON BEAMS; NEUTRON SOURCES; STATIC RANDOM ACCESS STORAGE;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 34548090964     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.902349     Document Type: Article

References (25)

1. J. F. Ziegler et al., "IBM experiments in soft fails in computer electronics (1978-1994)," IBM J. Res. Devel., vol. 40, no. 1, pp. 3-18, Jan. 1996.
2. P. E. Dodd, M. R. Shaneyfelt, J. R. Schwank, and G. L. Hash, "Neutroninduced soft errors, latchup, and comparison of SER test methods for SRAM technologies," in Proc. Int. Electron Device Meeting, 2002, pp. 333-336.
3. G. Gasiot and P. Roche, "Alpha-Induced multiple cell upsets in standard and radiation hardened SRAMs manufactured in a 65 nm. CMOS technology," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3479-3486, Dec. 2006.
4. J. George, R. Koga, G. Swift, G. Allen, C. Carmichael, and C. W. Tseng, "Single event upsets in Xilinx Virtex-4 FPGA devices," in NSREC Data Workshop, Ponte Vedra, FL, Jul. 2006, pp. 109-114.
5. D. M. Hiemstra, F. Chayab, and Z. Mohammed, "Single event upset characterization, of the Virtex-4 field programmable gate array using proton irradiation," in NSREC Data Workshop, Jul. 2006, pp. 105-108.
6. K. Morgan, M. Caffrey, P. Graham, E. Johnson, B. Pratt, and M. Wirthlin, "SEU-induced persistent error propagation in FPGAs," IEEE Trans. Nucl. Sci., vol. 52, no. 6, Dec. 2005.
7. R. Koga, J. George, G. Swift, C. Yui, L. Edmonds, C. Carmichael, T. Langley, P. Murray, K. Lanes, and M. Napier, "Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions," IEEE Trans. Nucl. Sci., vol. 51, no. 5, Oct. 2004.
8. M. Bellato, P. Bernardi, D. Bortolato, A. Candelori, M. Ceschia, A. Paccagnella, M. Rebaudengo, M. S. Reorda, M. Violante, and P. Zambolin, "Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA," Design, Automation and Test in Europe, pp. 188-193, 2004.
9. J. Fabula, J. Moore, A. Lesea, and S. Drimer, "The NSEU sensitivity of static latch, based FPGAs and flash storage CPLDs," presented at the Military and Aerospace Programmable Logic Devices Conf. (MAPLD), Washington, DC, Sep. 8-10, 2004.
10. Los Alamos Nuclear Science Center Los Alamos National Laboratory, 2006 [Online], Available: http://www.lansce.lanl.gov
11. TRIUMF Center for Molecular & Material Science TRIUMF, 2006 [Online]. Available: http://www.musr.org
12. Research Center for Nuclear Physics (RCNF) Osaka Univ., Japan, 2006 [Online], Available: http://www.osaka-u.ac.jp/eng/academ.ics/facilities/ nationwide/rcnp.html
13. E. Ibe, Y. Yahagi, F. Kataoka, Y. Saito, A. Eto, and M. Sato, "A self-Consistent integrated system, for terrestrial-neutron induced single event upset of semiconductor devices at the ground," presented at the Proc. Int. Conf. Information Technology and Application, Bathurst, Australia, Nov. 25-28, 2002.
14. H. Kobayashi, H. Usuki, K. Shiraishi, H. Tsuchiya, N. Kawamoto, and G. Merchant, "Comparison between neutron-induced system-SER and accelerated-SER in. SRAMs," in Proc. IEEE Int. Reliability Physics Symp., Phoenix, AZ, Apr. 25-29, 2004, pp. 288-293.
15. A. Lesea and J. Fabula, "The Rosetta experiment: Atmospheric soft error rate testing in differing technology FPGAs," presented at the 2nd Workshop on System. Effects of Logic Soft Errors, Urbana-Champaign, IL, Apr. 11-12, 2006.
16. N. Watanabe, "Neutronics of pulsed spallation neutron sources," Rep. Prog. Phys. 66, pp. 339-381, 2003.
17. The ISIS Accelerator ISIS, 2006 [Online]. Available: http://www. isis.rl.ac.uk/accelerator/
18. A. J. Peurrung, "Recent developments in neutron detection," Nucl. Instrum. Methods Phys. Res. A, pp. 400-415443, 2000.
19. S. P. Platt, B. Cassels, and Z. Torok, "Development and application of a neutron sensor for single event effects analysis," in J. Phys. Conf. Ser:, 2005, vol. 15, pp. 172-176.
20. S. P. Piatt and Z. Torok, "Analysis of SEE-inducing charge generation in the neutron beam at the Svedberg laboratory," presented at the RADECS Workshop, Athens, Greece, Sep. 27-29, 2006.
21. S. Brown, "FPGA architecture research: A survey," IEEE Des. Test Comput., pp. 9-15, 1996.
22. J. Rose, A. E. Gamal, and A. Sangiovanni-Vincetelli, "Architecture of field-programmable gate arrays," IEEE Proc, vol. 81, no. 7, pp. 1013-1029, Jul. 1993.
23. L. Sterpone and M. Violante, "A new reliability-oriented place and route algorithm for SRAM-based FPGAs," IEEE Trans. Comput., vol. 55, pp. 732-744, Jun. 2006.
24. TMRTool Sheet Xilinx, 2006 [Online], Available: http://www.xilinx. com/esp/mil_aero/collateral/tmrtooljsell.sheet_wr.pdf
25. Spartan-3 FPGA Family: Complete Data Sheet Xilinx Product Specification, 2006, DS099.