Neutron-induced soft error in logic devices using quasi-monoenergetic neutron beam

IEEE International Reliability Physics Symposium Proceedings

Volumn 2004-January, Issue January, 2004, Pages 305-309

  Yamamoto, S ^a   Kokuryou, K ^b   Okada, Y ^a   Komori, J ^a   Murakami, E ^a   Kubota, K ^a   Matsuoka, N ^c   Nagai, Y ^c  

^a RENESAS TECHNOLOGY CORP   (Japan)

^b Tada Electric Corporation   (Japan)

^c Research Center for Nuclear Physics (RCNP)   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FLIP FLOP CIRCUITS; LOGIC DEVICES; NEUTRON BEAMS; NEUTRONS; NUCLEAR REACTIONS; RADIATION HARDENING; STATIC RANDOM ACCESS STORAGE;

EMBEDDED SRAM; EMBEDDED SRAMS; LATCH CIRCUITS; LAYOUT DESIGNS; LIGHT PARTICLES; MEMORY NODES; QUASI-MONOENERGETIC NEUTRON BEAMS; SER ESTIMATIONS;

LOGIC CIRCUITS;

EID: 84932148906     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2004.1315342     Document Type: Conference Paper

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